Through-thickness texture profiling by energy dispersive synchrotron diffraction

Journal of Applied Crystallography

Volumn 43, Issue 6, 2010, Pages 1322-1328

  Coelho, R S ^a   Klaus, M ^a   Genzel, Ch ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

electron backscatter diffraction; energy dispersive diffraction; magnesium alloys; texture depth profiling

Indexed keywords

ATTENUATION LAW; AVERAGE INFORMATION; AZ31 MAGNESIUM ALLOY; CRYSTALLOGRAPHIC TEXTURES; DEPTH RESOLUTION; DIFFERENT ORDER; DIFFRACTED BEAMS; ELECTRON BACK SCATTER DIFFRACTION; ENERGY DISPERSIVE; ENERGY DISPERSIVE DIFFRACTIONS; ENERGY-DISPERSIVE DIFFRACTION; GAUGE VOLUMES; MODEL MATERIALS; NEW APPROACHES; NONDESTRUCTIVE METHODS; POLE FIGURE; REAL-SPACE; SYNCHROTRON DIFFRACTION; TEXTURE DEPTH; TEXTURE GRADIENT; THICKNESS VARIATION;

ALLOYS; BACKSCATTERING; ELECTRON DIFFRACTION; GAGES; MAGNESIUM; MAGNESIUM ALLOYS; TEXTURES;

DEPTH PROFILING;

EID: 78649507107     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889810037210     Document Type: Article

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