메뉴 건너뛰기




Volumn 258, Issue 1, 2011, Pages 2-6

Wafer-level fabrication and optical characterization of nanoscale patterned sapphire substrates

Author keywords

Antireflection; Natural lithography; Patterned sapphire

Indexed keywords

FABRICATION; INDUCTIVELY COUPLED PLASMA; LITHOGRAPHY; NANOSTRUCTURES; NICKEL COMPOUNDS; OPTICAL PROPERTIES; REFLECTION; SAPPHIRE; SILICIDES;

EID: 80054771088     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.07.117     Document Type: Article
Times cited : (28)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.