Measuring the top-bottom effect of a tilted thick specimen in an ultrahigh-voltage electron microscope

Review of Scientific Instruments

Volumn 76, Issue 5, 2005, Pages

  Zhang, Hai Bo ^a   Yang, Chao ^a   Takaoka, Akio ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD PARTICLES; IMAGE BLURRING; SPECIMEN; TOP-BOTTOM EFFECTS;

CHARGE COUPLED DEVICES; ELECTRIC POTENTIAL; FOURIER TRANSFORMS; GOLD; IMAGE ANALYSIS; OPTICAL RESOLVING POWER; SURFACE PHENOMENA; THICKNESS MEASUREMENT; TOMOGRAPHY;

ELECTRON MICROSCOPES;

EID: 18744415727     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1914773     Document Type: Article

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