The top-bottom effect of a tilted thick specimen and its influence on electron tomography

Journal of Electron Microscopy

Volumn 54, Issue 4, 2005, Pages 367-371

  Yang, Chao ^a   Zhang, Hai Bo ^a   Li, Jing Jing ^a   Takaoka, Akio ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Electron tomography; Image quality; Point spread function; Thick specimen; Top bottom effect; Transmission electron microscopy (TEM)

Indexed keywords

ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRONS; GOLD; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; OPTICAL TRANSFER FUNCTION;

BOTTOM SURFACES; ELECTRON TOMOGRAPHY; GOLD PARTICLES; PARTICLE IMAGES; POINT-SPREAD FUNCTION; THICK SPECIMEN; TOP SURFACE; TOP-BOTTOM EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; VOLTAGE ELECTRONS;

IMAGE QUALITY;

EID: 27944476950     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfi057     Document Type: Article

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