Theory of bright-field scanning transmission electron microscopy for tomography

Journal of Applied Physics

Volumn 97, Issue 3, 2005, Pages

  Levine, Zachary H ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC SCATTERING; RADIATION TRANSPORT THEORY; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); TOMOGRAPHIC RECONSTRUCTIONS;

ALGORITHMS; AMORPHOUS MATERIALS; BAND STRUCTURE; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; MATHEMATICAL MODELS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY;

TOMOGRAPHY;

EID: 13644274226     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1828604     Document Type: Article

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