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Applied Physics Letters

Volumn 99, Issue 11, 2011, Pages

Electroforming and endurance behavior of Al/Pr0.7Ca 0.3MnO3/Pt devices

(7) Liao, Zhaoliang a,b Gao, Peng a Meng, Yang a Zhao, Hongwu a Bai, Xuedong a Zhang, Jiandi b Chen, Dongmin a

a INSTITUTE OF PHYSICS (China)

b LOUISIANA STATE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AL ELECTRODE; OXIDIZATION; POSITIVE BIAS; PT ELECTRODE; RESISTIVE SWITCHING; TRANSPORT MEASUREMENTS;

DURABILITY; ELECTROCHEMISTRY; ELECTROFORMING; ELECTROMETALLURGY; MANGANESE OXIDE; PLATINUM; TRANSMISSION ELECTRON MICROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 80053188674 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3638059 Document Type: Article

Times cited : (21)

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