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Volumn 58, Issue 6, 1997, Pages 969-976

The defect structure of SrTi1 - xFexO3 - y (x = 0-0.8) investigated by electrical conductivity measurements and electron energy loss spectroscopy (EELS)

Author keywords

A. perovskites; A. SrTi1 xFexO3 y; C. electron energy loss spectroscopy; D. defect structure; D. electrical conductivity

Indexed keywords

ACTIVATION ENERGY; COMPOSITION EFFECTS; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY GAP; HIGH TEMPERATURE EFFECTS; IONIC CONDUCTION IN SOLIDS; PEROVSKITE; PRESSURE EFFECTS; X RAY CRYSTALLOGRAPHY;

EID: 0031164317     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(96)00200-4     Document Type: Article
Times cited : (341)

References (25)
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    • Bieger, T., Maier, J. and Waser, R., Proc. 7th Cimtec Conf. (ed. P. Vincenzini). Elsevier Sci. Publishers B.V., Montecatini, Italy, 1991, p. 623.
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  • 12
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.