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Volumn 8, Issue , 2011, Pages 479-486

Towards industrial n-type PERT silicon solar cells: Rear passivation and metallization scheme

Author keywords

Back surface field; N type silicon solar cell; Rear passivation

Indexed keywords

ALUMINUM; ATOMIC LAYER DEPOSITION; BORON; EFFICIENCY; METALLIZING; PASSIVATION; SEMICONDUCTING SILICON; SILICON; SILICON NITRIDE; SOLAR CELLS;

EID: 80052099629     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.06.169     Document Type: Conference Paper
Times cited : (30)

References (27)
  • 3
    • 0040028982 scopus 로고    scopus 로고
    • Minority carrier lifetime degradation in boron-doped Czochralski silicon
    • DOI 10.1063/1.1389076
    • Glunz SW, Rein S, Lee JY, and Warta W. Minority carrier lifetime degradation in boron-doped Czochralski silicon. J. Appl. Phys. 2001; 90:2397-404. (Pubitemid 33600658)
    • (2001) Journal of Applied Physics , vol.90 , Issue.5 , pp. 2397-2404
    • Glunz, S.W.1    Rein, S.2    Lee, J.Y.3    Warta, W.4
  • 4
    • 1442337113 scopus 로고    scopus 로고
    • Structure and transformation of the metastable boron- and oxygen-related defect center in crystalline silicon
    • Schmidt J and Bothe K. Structure and transformation of the metastable boron- and oxygen-related defect center in crystalline silicon. Phys. Rev. B 2004; 69:0241071-78.
    • (2004) Phys. Rev. B , vol.69 , pp. 0241071-0241078
    • Schmidt, J.1    Bothe, K.2
  • 5
    • 10044269932 scopus 로고    scopus 로고
    • Recombination activity of interstitial iron and other transition metal point defects in p- and ntype crystalline silicon
    • Macdonald D and Geerligs LJ. Recombination activity of interstitial iron and other transition metal point defects in p- and ntype crystalline silicon. Appl. Phys. Lett. 2004; 85:4061-3.
    • (2004) Appl. Phys. Lett. , vol.85 , pp. 4061-4063
    • Macdonald, D.1    Geerligs, L.J.2
  • 11
    • 72449170046 scopus 로고    scopus 로고
    • x:H stacks for surface passivation of crystalline silicon
    • x:H stacks for surface passivation of crystalline silicon. J. Appl. Phys. 2009; 106:114907.
    • (2009) J. Appl. Phys. , vol.106 , pp. 114907
    • Dingemans, G.1
  • 18
    • 79951841259 scopus 로고    scopus 로고
    • Surface passivation of crystalline silicon by plasma-enhanced chemical vapor deposition double layers of silicon-rich oxynitride and silicon nitride
    • Seiffe J, et al. Surface passivation of crystalline silicon by plasma-enhanced chemical vapor deposition double layers of silicon-rich oxynitride and silicon nitride. J. Appl. Phys. 2011; 109:034105.
    • (2011) J. Appl. Phys. , vol.109 , pp. 034105
    • Seiffe, J.1
  • 19
    • 0000513411 scopus 로고    scopus 로고
    • Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data
    • Sinton RA and Cuevas A. Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi-steady-state photoconductance data. Appl. Phys. Lett. 1996; 69:2510-2. (Pubitemid 126595545)
    • (1996) Applied Physics Letters , vol.69 , Issue.17 , pp. 2510-2512
    • Sinton, R.A.1    Cuevas, A.2
  • 20
    • 79953661623 scopus 로고    scopus 로고
    • Charge carrier trapping at passivated silicon surfaces
    • Seiffe J, Hofmann M, Rentsch J, and Preu R. Charge carrier trapping at passivated silicon surfaces. J. Appl. Phys. 2011; 109:064505.
    • (2011) J. Appl. Phys. , vol.109 , pp. 064505
    • Seiffe, J.1    Hofmann, M.2    Rentsch, J.3    Preu, R.4
  • 21
    • 0345767385 scopus 로고    scopus 로고
    • Measuring and interpreting the lifetime of silicon wafers
    • DOI 10.1016/j.solener.2003.07.033
    • Cuevas A and Macdonald D. Measuring and interpreting the lifetime of silicon wafers. Solar Energy 2004; 76:255-62. (Pubitemid 38047639)
    • (2004) Solar Energy , vol.76 , Issue.1-3 , pp. 255-262
    • Cuevas, A.1    Macdonald, D.2
  • 22
    • 0022306789 scopus 로고
    • Measurement of the emitter saturation current by a contactless photoconductivity decay method (silicon solar cells)
    • Las Vegas, Nevada, USA
    • Kane DE and Swanson RM. Measurement of the emitter saturation current by a contactless photoconductivity decay method (silicon solar cells). Proceedings of the 18th IEEE Photovoltaic Specialists Conference, Las Vegas, Nevada, USA, 1985.
    • (1985) Proceedings of the 18th IEEE Photovoltaic Specialists Conference
    • Kane, D.E.1    Swanson, R.M.2
  • 24
    • 0021424371 scopus 로고
    • Contact resistance: Its measurement and relative importance to power loss in a solar cell
    • Meier DL and Schroder DK. Contact resistance: its measurement and relative importance to power loss in a solar cell. IEEE Trans. Electron Devices 1984; ED-31:647-53.
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 647-653
    • Meier, D.L.1    Schroder, D.K.2
  • 25
    • 0015094463 scopus 로고
    • Specific contact resistance of metal-semiconductor barriers
    • Chang CY, Fang YK, and Sze SM. Specific contact resistance of metal-semiconductor barriers. Solid State Electronics 1971; 14:541-50.
    • (1971) Solid State Electronics , vol.14 , pp. 541-550
    • Chang, C.Y.1    Fang, Y.K.2    Sze, S.M.3
  • 27
    • 34548247286 scopus 로고    scopus 로고
    • A review and comparison of different methods to determine the series resistance of solar cells
    • DOI 10.1016/j.solmat.2007.05.026, PII S0927024807002255
    • Pysch D, Mette A, and Glunz SW. A review and comparison of different methods to determine the series resistance of solar cells. Solar Energy Materials & Solar Cells 2007; 91:1698-706. (Pubitemid 47321115)
    • (2007) Solar Energy Materials and Solar Cells , vol.91 , Issue.18 , pp. 1698-1706
    • Pysch, D.1    Mette, A.2    Glunz, S.W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.