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Volumn 3, Issue 7-8, 2009, Pages 233-235
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Thermal stability of the Al2O3 passivation on p-type silicon surfaces for solar cell applications
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Author keywords
[No Author keywords available]
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Indexed keywords
BORON-DOPED;
CONTACT FORMATION;
EMITTER SATURATION CURRENT DENSITY;
FIRING PROCESS;
FIRING STABILITY;
FIRING TEMPERATURE;
HIGH-TEMPERATURE FIRING;
METALLIZATIONS;
MODERATE TEMPERATURE;
N TYPE SILICON;
P-TYPE;
P-TYPE SILICON;
PRINTING TECHNOLOGIES;
SOLAR-CELL APPLICATIONS;
THERMAL STABILITY;
ALUMINUM;
BORON;
OPEN CIRCUIT VOLTAGE;
SILICON SOLAR CELLS;
SOLAR CELLS;
THERMODYNAMIC STABILITY;
PASSIVATION;
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EID: 71149088288
PISSN: 18626254
EISSN: 18626270
Source Type: Journal
DOI: 10.1002/pssr.200903209 Document Type: Article |
Times cited : (109)
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References (16)
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