Nanometer-scale dielectric imaging of semiconductor nanoparticles: Size-dependent dipolar coupling and contrast reversal

Nano Letters

Volumn 7, Issue 8, 2007, Pages 2258-2262

  Kim, Zee Hwan ^a   Ahn, Sung Hyun ^a   Liu, Bing ^b,c   Leone, Stephen R ^b  

^a Korea University   (South Korea)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c IMRA AMERICA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; IMAGE RESOLUTION; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR DEVICE MODELS; SUBSTRATES; WAVELENGTH;

APERTURELESS NEAR-FIELD MICROSCOPY (ANSOM); DIELECTRIC IMAGING; DIPOLAR COUPLING; SEMICONDUCTOR NANOPARTICLES;

NANOPARTICLES;

NANOMATERIAL;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; IMPEDANCE; MACROMOLECULE; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE;

CRYSTALLIZATION; ELECTRIC IMPEDANCE; MACROMOLECULAR SUBSTANCES; MATERIALS TESTING; MICROSCOPY, ATOMIC FORCE; MOLECULAR CONFORMATION; NANOSTRUCTURES; NANOTECHNOLOGY; PARTICLE SIZE; SEMICONDUCTORS; SURFACE PROPERTIES;

EID: 34548145888     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070753k     Document Type: Article

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