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42
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36748999383
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Importance of the debye screening length on nanowire field effect transistor sensors
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DOI 10.1021/nl071792z
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Stern, E.; Wagner, R.; Sigworth, F. J.; Breaker, R.; Fahmy, T. M.; Reed, M. A. Importance of the Debye Screening Length on Nanowire Field Effect Transistor Sensors Nano Lett. 2007, 7, 3405-3409 (Pubitemid 350216036)
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(2007)
Nano Letters
, vol.7
, Issue.11
, pp. 3405-3409
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Stern, E.1
Wagner, R.2
Sigworth, F.J.3
Breaker, R.4
Fahmy, T.M.5
Reed, M.A.6
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