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Volumn 509, Issue 35, 2011, Pages 8676-8682

Realization of stable p-type ZnO thin films using Li-N dual acceptors

Author keywords

Electrical resistivity; Optical properties; p ZnO; Strain; Structural properties

Indexed keywords

AFM; C-AXIS ORIENTATIONS; CHEMICAL BONDING STATE; CRYSTALLINITIES; DEEP LEVEL; ELECTRICAL RESISTIVITY; HALL EFFECT MEASUREMENT; HALL MEASUREMENTS; INTRINSIC DEFECTS; LOW DENSITY; LOW-INTENSITY; NATIVE DEFECT; P TYPE ZNO THIN FILM; P-TYPE CONDUCTIVITY; P-ZNO; PL SPECTRA; ROOM TEMPERATURE; SPRAY-PYROLYSIS TECHNIQUES; UV EMISSIONS; XPS ANALYSIS; ZNO THIN FILM;

EID: 80051784146     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2011.05.094     Document Type: Article
Times cited : (33)

References (47)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.