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Volumn 77, Issue 163, 2010, Pages 64-74

XPS structure analysis of TiN/TiC bilayers produced by pulsed vacuum arc discharge;Análisis estructural de bicapas de TiN/TiC producidas por descargas pulsadas por arco en vacío

Author keywords

Chemical composition; Depth profiles; PAPVD; Stoichiometry; XPS

Indexed keywords


EID: 80051557882     PISSN: 00127353     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (35)

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