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Volumn 83, Issue 12, 2011, Pages

Copper-related deep-level centers in irradiated p-type silicon

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EID: 79961095209     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.125207     Document Type: Article
Times cited : (22)

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