Electronic structure of the SiNx/TiN interface: A model system for superhard nanocomposites

Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 12, 2011, Pages

  Patscheider, Jörg ^a,b   Hellgren, Niklas ^b,c   Haasch, Richard T ^b   Petrov, Ivan ^b   Greene, J E ^b  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b University of Illinois at Urbana Champaign   (United States)

^c MESSIAH COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961051520     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.125124     Document Type: Article

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