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Volumn 98, Issue 24, 2011, Pages

Self-aligned metal source/drain InP n-metal-oxide-semiconductor field-effect transistors using Ni-InP metallic alloy

Author keywords

[No Author keywords available]

Indexed keywords

INP; METAL SOURCE/DRAIN; METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR; METALLIC ALLOYS; MOSFETS; SELF-ALIGN; SELF-ALIGNED; SUBTHRESHOLD SWING;

EID: 79960601065     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3597228     Document Type: Article
Times cited : (27)

References (20)
  • 17
    • 79960576925 scopus 로고
    • Japanese Patent No. 587 527.
    • Y. Nishi, Japanese Patent No. 587 527 (1970).
    • (1970)
    • Nishi, Y.1
  • 19
    • 0036133199 scopus 로고    scopus 로고
    • NiSi salicide technology for scaled CMOS
    • DOI 10.1016/S0167-9317(01)00684-0, PII S0167931701006840
    • H. Iwai, T. Ohguro, and S. Ohmi, Microelectron. Eng. 0167-9317 60, 157 (2002). 10.1016/S0167-9317(01)00684-0 (Pubitemid 33146991)
    • (2002) Microelectronic Engineering , vol.60 , Issue.1-2 , pp. 157-169
    • Iwai, H.1    Ohguro, T.2    Ohmi, S.-I.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.