Imaging with low-voltage scanning transmission electron microscopy: A quantitative analysis

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1018-1028

  Felisari, L ^a   Grillo, V ^b,c   Jabeen, F ^a   Rubini, S ^a   Menozzi, C ^b,d   Rossi, F ^c   Martelli, F ^a,b  

^a LABORATORIO TASC   (Italy)

^b CNR   (Italy)

^c IMEM CNR   (Italy)

^d UNIVERSITY OF MODENA AND REGGIO EMILIA   (Italy)

Author keywords

Channelling; Low energy STEM; Mass thickness contrast; Nanowires; Quantitative STEM

Indexed keywords

ABSORPTION COEFFICIENTS; CHANNELLING; COMPOSITIONAL ANALYSIS; CORE-SHELL NANOWIRES; DARK FIELD MODES; IMAGE INTENSITIES; INGAAS/GAAS; LOW ENERGY STEM; LOW VOLTAGES; LOW-VOLTAGE; MASS-THICKNESS CONTRAST; MODEL-BASED OPC; QUANTITATIVE INTERPRETATION; QUANTITATIVE STEM; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCATTERING CONTRAST; TEST SAMPLES;

ABSORPTION; NANOWIRES; PROBES; SEMICONDUCTING INDIUM;

TRANSMISSION ELECTRON MICROSCOPY;

GOLD NANOPARTICLE; NANOWIRE;

ABSORPTION; ABSORPTION COEFFICIENT; ANALYTICAL PARAMETERS; ARTICLE; ARTIFACT; CATALYST; CHANNELLING PHENOMENON; CONTRAST; CONTROLLED STUDY; ELECTRON BEAM; IMAGE INTENSIFIER; IMAGE QUALITY; LOW VOLTAGE SCANNING TRANSMISSION ELECTRON MICROSCOPY; QUANTITATIVE ANALYSIS; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 79960001834     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.03.016     Document Type: Article

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