Subtleties in ADF imaging and spatially resolved EELS: A case study of low-angle twist boundaries in SrTiO3

Ultramicroscopy

Volumn 106, Issue 11-12 SPEC. ISS., 2006, Pages 1053-1061

  Fitting, L ^a   Thiel, S ^b   Schmehl, A ^b   Mannhart, J ^b   Muller, D A ^a  

^a Cornell University   (United States)

^b UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Low angle twist boundary; Spatially resolved EELS; STEM

Indexed keywords

COMPUTER SIMULATION; DISLOCATIONS (CRYSTALS); ELECTRON ENERGY LOSS SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; STRONTIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ANNULAR DARK FIELD (ADF) IMAGING; LOW-ANGLE TWIST BOUNDARY; SPATIALLY RESOLVED EELS; STEM;

IMAGING SYSTEMS;

OXYGEN; STRONTIUM; TITANIUM;

ARTICLE; ELASTICITY; ELECTRON; GEOMETRY; SIGNAL TRANSDUCTION; SPATIAL ORIENTATION; SPECTROSCOPY;

EID: 33749326642     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2006.04.019     Document Type: Article

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