Contrast and resolution versus specimen thickness in low energy scanning transmission electron microscopy

Journal of Applied Physics

Volumn 101, Issue 11, 2007, Pages

  Morandi, Vittorio ^a   Merli, Pier Giorgio ^a  

^a CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR DISTRIBUTION; ENERGY DISSIPATION; IMAGING SYSTEMS; MULTILAYERS; SIGNAL TO NOISE RATIO; TRANSMISSION ELECTRON MICROSCOPY;

CONTRAST ANALYSIS; LOW ENERGY SCANNING TRANSMISSION ELECTRON MICROSCOPY; PROBE SIZE; SEMICONDUCTOR MULTILAYERS;

IMAGE RESOLUTION;

EID: 34250643631     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2745333     Document Type: Article

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