-
2
-
-
77950825418
-
The impact investigation of CSP IC packaging on halogen-free board-level performance
-
Yu, C. K., Chang, G., Shao, T., Chen, C., and Lee, J., 2009, The Impact Investigation of CSP IC Packaging on Halogen-Free Board-Level Performance., Proceedings of International Microsystems, Packaging, Assembly and Circuit Technology Conference, pp. 666-669.
-
(2009)
Proceedings of International Microsystems, Packaging, Assembly and Circuit Technology Conference
, pp. 666-669
-
-
Yu, C.K.1
Chang, G.2
Shao, T.3
Chen, C.4
Lee, J.5
-
3
-
-
27644459659
-
Mechanical bend fatigue reliability of lead-free and halogen-free PBGA Assemblies
-
DOI 10.1109/TCAPT.2005.853924
-
Jonnalagadda, K., Qi, F., and Liu, J., 2005, Mechanical Bend Fatigue Reliability of Lead-Free and Halogen-Free PBGA Assemblies., IEEE Trans. Compon. Packag. Technol, 28 (3), pp. 430-434. 10.1109/TCAPT.2005.853924 (Pubitemid 41555804)
-
(2005)
IEEE Transactions on Components and Packaging Technologies
, vol.28
, Issue.3
, pp. 430-434
-
-
Jonnalagadda, K.1
Qi, F.2
Liu, J.3
-
4
-
-
70349683448
-
Materials technology for environmentally green micro-electronic packaging
-
10.1535/itj.1201
-
Renavikar, M. P., Patel, N., Dani, A., Wakharkar, V., Arrigotti, G., Vasudevan, V., Bchir, O., Alur, A. P., Gurumurthy, C. K., and Stage, R. W., 2008, Materials Technology for Environmentally Green Micro-Electronic Packaging., Intel Technol. J., 12 (1), pp. 1-14. 10.1535/itj.1201
-
(2008)
Intel Technol. J.
, vol.12
, Issue.1
, pp. 1-14
-
-
Renavikar, M.P.1
Patel, N.2
Dani, A.3
Wakharkar, V.4
Arrigotti, G.5
Vasudevan, V.6
Bchir, O.7
Alur, A.P.8
Gurumurthy, C.K.9
Stage, R.W.10
-
5
-
-
33748571136
-
The influence of substrate enhancement on moisture sensitivity level (MSL) performance for green PBGA packages
-
DOI 10.1109/TCAPT.2006.880450
-
Lin, T. Y., Pecht, M. G., Das, D., and Teo, K. C., 2006, The Influence of Substrate Enhancement on Moisture Sensitive Level (MSL) Performance for Green PBGA Packages., IEEE Trans. Compon. Packag. Technol., 29 (3), pp. 522-527. 10.1109/TCAPT.2006.880450 (Pubitemid 44363910)
-
(2006)
IEEE Transactions on Components and Packaging Technologies
, vol.29
, Issue.3
, pp. 522-527
-
-
Lin, T.Y.1
Pecht, M.G.2
Das, D.3
Teo, K.C.4
-
6
-
-
35348910733
-
Impact performance of microvia and buildup layer materials and its contribution to drop test failures
-
DOI 10.1109/ECTC.2007.373827, 4249913, Proceedings - 57th Electronic Components and Technology Conference 2007, ECTC '07
-
Xie, D., Wang, J., Yu, H., Lau, D., and Shangguan, D., 2007, Impact Performance of Microvia and Buildup Layer Materials and Its Contribution to Drop Test Failures., Proceedings of Electronic Component and Technology Conference, pp. 391-399. (Pubitemid 47577060)
-
(2007)
Proceedings - Electronic Components and Technology Conference
, pp. 391-399
-
-
Xie, D.1
Wang, J.2
Yu, H.3
Lau, D.4
Shangguan, D.5
-
8
-
-
22944455854
-
Submodeling analysis for path-dependent thermomechanical problems
-
DOI 10.1115/1.1869513
-
Wang, T. H., and Lai, Y. S., 2005, Submodeling Analysis for Path-Dependent Thermomechanical Problems., J. Electron. Packag., 127 (2), pp. 135-140. 10.1115/1.1869513 (Pubitemid 41048435)
-
(2005)
Journal of Electronic Packaging, Transactions of the ASME
, vol.127
, Issue.2
, pp. 135-140
-
-
Wang, T.H.1
Lai, Y.-S.2
-
10
-
-
0037076832
-
Six cases of Reliability Study of Pb-Free Solder Joints in Electron Packaging Technology
-
10.1016/S0927-796X(02)00007-4
-
Zeng, K., and Tu, K. N., 2002, Six cases of Reliability Study of Pb-Free Solder Joints in Electron Packaging Technology., Mater. Sci. Eng. Rep., R38, pp. 55-105. 10.1016/S0927-796X(02)00007-4
-
(2002)
Mater. Sci. Eng. Rep.
, vol.38
, pp. 55-105
-
-
Zeng, K.1
Tu, K.N.2
-
11
-
-
20344388336
-
Interfacial reactions between lead-free solders and common base materials
-
DOI 10.1016/j.mser.2005.03.001, PII S0927796X05000513
-
Laurila, T., Vuorinen, V., and Kivilahti, J. K., 2005, Interfacial Reactions Between Lead-Free Solders and Common Base Materials., Mater. Sci. Eng. Rep., 49, pp. 1-60. 10.1016/j.mser.2005.03.001 (Pubitemid 40788671)
-
(2005)
Materials Science and Engineering R: Reports
, vol.49
, Issue.1-2
, pp. 1-60
-
-
Laurila, T.1
Vuorinen, V.2
Kivilahti, J.K.3
-
12
-
-
0034293761
-
Effect of Soldering and Aging Time on Interfacial Microstructure and Growth of Intermetallic Compounds Between Sn-3.5Ag solder Alloy and Cu Substrate
-
10.1007/s11664-000-0014-7
-
Choi, W. K., and Lee, K. M., 2000, Effect of Soldering and Aging Time on Interfacial Microstructure and Growth of Intermetallic Compounds Between Sn-3.5Ag solder Alloy and Cu Substrate., J. Electron. Mater., 29 (10), pp. 1207-1213. 10.1007/s11664-000-0014-7
-
(2000)
J. Electron. Mater.
, vol.29
, Issue.10
, pp. 1207-1213
-
-
Choi, W.K.1
Lee, K.M.2
-
13
-
-
0036864459
-
Influence of substrate metallization on diffusion and reaction at the under-bump metallization/solder interface in flip-chip packages
-
10.1557/JMR.2002.0397
-
Zhang, F., Li, M., Chum, C. C., and Tu, K. N., 2002, Influence of Substrate Metallization on Diffusion and Reaction at the Under-Bump Metallization/Solder Interface in Flip-Chip Packages., J. Mater. Res., 17 (11), pp. 2757-2760. 10.1557/JMR.2002.0397
-
(2002)
J. Mater. Res.
, vol.17
, Issue.11
, pp. 2757-2760
-
-
Zhang, F.1
Li, M.2
Chum, C.C.3
Tu, K.N.4
-
14
-
-
33745040036
-
Effects of limited Cu supply on soldering reactions between SnAgCu and Ni
-
Ho, C. E., Lin, Y. W., Yang, S. C., Kao, C. R., and Jiang, D. S., 2006, Effects of Limited Cu Supply on Soldering Reactions Between SnAgCu and Ni., J. Electron. Mater., 35 (5), pp. 1017-1024. 10.1007/BF02692562 (Pubitemid 43875265)
-
(2006)
Journal of Electronic Materials
, vol.35
, Issue.5
, pp. 1017-1024
-
-
Ho, C.E.1
Lin, Y.W.2
Yang, S.C.3
Kao, C.R.4
Jiang, D.S.5
-
15
-
-
11344293153
-
Dissolution of electroless Ni metallization by lead-free solder alloys
-
DOI 10.1016/j.jallcom.2004.07.015, PII S0925838804009260
-
Sharif, A., Chan, Y. C., Islam, M. N., and Rizvi, M. J., 2005, Dissolution of Electroless Ni Metallization by Lead-Free Solder Alloys., J. Alloys Compd., 388 (1), pp. 75-82. 10.1016/j.jallcom.2004.07.015 (Pubitemid 40073362)
-
(2005)
Journal of Alloys and Compounds
, vol.388
, Issue.1
, pp. 75-82
-
-
Sharif, A.1
Chan, Y.C.2
Islam, M.N.3
Rizvi, M.J.4
-
16
-
-
0036477472
-
Effect of Cu concentration on the interfacial reactions between Ni and Sn-Cu solders
-
Chen, W. T., Ho, C. E., and Kao, C. R., 2002, Effect of Cu Concentration on the Interfacial Reactions Between Ni and Sn-Cu Solders., J. Mater. Res., 17 (2), pp. 263-266. 10.1557/JMR.2002.0036 (Pubitemid 34574541)
-
(2002)
Journal of Materials Research
, vol.17
, Issue.2
, pp. 263-266
-
-
Chen, W.T.1
Ho, C.E.2
Kao, C.R.3
-
17
-
-
33845692077
-
Interfacial reaction issues for lead-free electronic solders
-
DOI 10.1007/s10854-006-9031-5
-
Ho, C. E., Yang, S. C., and Kao, C. R., 2007, Interfacial Reaction Issues for Lead-Free Electronic Solders., J. Mater. Sci.: Mater. Electron., 18, pp. 155-174. 10.1007/s10854-006-9031-5 (Pubitemid 44963683)
-
(2007)
Journal of Materials Science: Materials in Electronics
, vol.18
, Issue.1-3
, pp. 155-174
-
-
Ho, C.E.1
Yang, S.C.2
Kao, C.R.3
-
18
-
-
85199286224
-
-
Applied Research and Technological Department, European Technological Center, Spain.
-
Alonso, J. C., and Cubero, J. A., Use of Pb-Free Solder Alloys in Electrical and Electronic Devices for the Automotive Industry, Applied Research and Technological Department, European Technological Center, Spain.
-
Use of Pb-Free Solder Alloys in Electrical and Electronic Devices for the Automotive Industry
-
-
Alonso, J.C.1
Cubero, J.A.2
-
19
-
-
0034297367
-
Copper substrate dissolution in eutectic Sn-Ag solder and its effect on microstructure
-
10.1007/s11664-000-0015-6
-
Chada, S., Fournelle, R. A., Laub, W., and Shangguan, D., 2000, Copper Substrate Dissolution in Eutectic Sn-Ag Solder and Its Effect on Microstructure., J. Electron. Mater., 29 (10), pp. 1214-1221. 10.1007/s11664-000-0015-6
-
(2000)
J. Electron. Mater.
, vol.29
, Issue.10
, pp. 1214-1221
-
-
Chada, S.1
Fournelle, R.A.2
Laub, W.3
Shangguan, D.4
-
20
-
-
15544387649
-
IMC morphology, interfacial reaction and joint reliability of Pb-free Sn-Ag-Cu solder on electrolytic Ni BGA substrate
-
DOI 10.1016/j.jallcom.2004.09.045, PII S0925838804012356
-
Yoon, J. W., Kim, S. W., and Jung, S. B., 2005, IMC Morphology, Interfacial Reaction and Joint Reliability of Pb-Free Sn-Ag-Cu Solder on Electrolytic Ni BGA Substrate., J. Alloys Compd., 392, pp. 247-252. 10.1016/j.jallcom.2004.09.045 (Pubitemid 40402902)
-
(2005)
Journal of Alloys and Compounds
, vol.392
, Issue.1-2
, pp. 247-252
-
-
Yoon, J.-W.1
Kim, S.-W.2
Jung, S.-B.3
-
21
-
-
0035455482
-
Morphological stability of solder reaction products in flip chip technology
-
Lead-Free Solder Materials and Soldering Technologies
-
Tu, K. N., Ku, F., and Lee, T. Y., 2001, Morphological Stability of Solder Reaction Products in Flip Chip Technology., J. Electron. Mater., 30 (9), pp. 1129-1132. 10.1007/s11664-001-0139-3 (Pubitemid 33090676)
-
(2001)
Journal of Electronic Materials
, vol.30
, Issue.9
, pp. 1129-1132
-
-
Tu, K.N.1
Ku, F.2
Lee, T.Y.3
-
22
-
-
0034333902
-
3P due to solder reaction-assisted crystallization of electroless Ni-P metallization in advanced packages
-
3P Due to Solder Reaction-Assisted Crystallization of Electroless Ni-P Metallization in Advanced Packages., J. Mater. Res., 15 (11), pp. 2534-2539. 10.1557/JMR.2000. 0363 (Pubitemid 34574027)
-
(2000)
Journal of Materials Research
, vol.15
, Issue.11
, pp. 2534-2539
-
-
Hung, K.C.1
Chan, Y.C.2
Tang, C.W.3
Ong, H.C.4
-
23
-
-
60849105954
-
Kirkendall voids formation in the reaction between Ni-doped SnAg Pb-free solder and different Cu substrates
-
10.1016/j.microrel.2008.09.010
-
Wang, Y. W., Lin, Y. W., and Kao, C. R., 2009, Kirkendall Voids Formation in the Reaction Between Ni-Doped SnAg Pb-Free Solder and Different Cu Substrates., Microelectron. Reliab., 49 (3), pp. 248-252. 10.1016/j.microrel. 2008.09.010
-
(2009)
Microelectron. Reliab.
, vol.49
, Issue.3
, pp. 248-252
-
-
Wang, Y.W.1
Lin, Y.W.2
Kao, C.R.3
-
24
-
-
23244448289
-
Failure mechanisms of lead-free chip scale package interconnections under fast mechanical loading
-
Mattila, T., and Kivilahti, J., 2005, Failure Mechanisms of Lead-Free Chip Scale Package Interconnections Under Fast Mechanical Loading., J. Electron. Mater., 34 (7), pp. 969-976. 10.1007/s11664-005-0084-7 (Pubitemid 41091891)
-
(2005)
Journal of Electronic Materials
, vol.34
, Issue.7
, pp. 969-976
-
-
Mattila, T.T.1
Kivilahti, J.K.2
-
25
-
-
33644913104
-
Nano-indentation characterization of Ni-Cu-Sn IMC layer subject to isothermal aging
-
10.1016/j.tsf.2005.09.056
-
Xu, L., and Pang, J. H. L., 2006, Nano-Indentation Characterization of Ni-Cu-Sn IMC Layer Subject to Isothermal Aging., Thin Solid Films, 504, pp. 362-366. 10.1016/j.tsf.2005.09.056
-
(2006)
Thin Solid Films
, vol.504
, pp. 362-366
-
-
Xu, L.1
Pang, J.H.L.2
-
26
-
-
50049130731
-
Ag content effect on mechanical properties of Sn-xAg-0.5Cu solders
-
Che, F. X., Poh, E. C., Zhu, W. H., and Xiong, B. S., 2007, Ag Content Effect on Mechanical Properties of Sn-xAg-0.5Cu Solders., Proceedings of Electronics Packaging Technology Conference, pp. 713-718.
-
(2007)
Proceedings of Electronics Packaging Technology Conference
, pp. 713-718
-
-
Che, F.X.1
Poh, E.C.2
Zhu, W.H.3
Xiong, B.S.4
-
27
-
-
35348848368
-
A component level test method for evaluating the resistance of Pb-free BGA solder joints to brittle fracture under shock impact
-
DOI 10.1109/ECTC.2007.373996, 4250082, Proceedings - 57th Electronic Components and Technology Conference 2007, ECTC '07
-
Zhao, X. J., Caers, J. F. J. M., dc Vries, J. W. C., Wong, E. H., and Rajoo, R., 2007, A Component Level Test Method for Evaluating the Resistance of Pb-Free BGA Solder Joints to Brittle Fracture Under Shock Impact., Proceedings of Electronics Packaging Technology Conference, pp. 1522-1529. (Pubitemid 47577229)
-
(2007)
Proceedings - Electronic Components and Technology Conference
, pp. 1522-1529
-
-
Zhao, X.J.1
Caers, J.F.J.M.2
De Vries, J.W.C.3
Wong, E.H.4
Rajoo, R.5
-
28
-
-
34247145459
-
Effects of Ag content on fracture resistance of Sn-Ag-Cu lead-free solders under high-strain rate conditions
-
DOI 10.1016/j.msea.2007.01.145, PII S0921509307001852
-
Suh, D., Kim, D. W., Liu, P., Kim, H., Weninger, J. A., Kumar, C. M., Prasad, A., Grimsley, B. W., and Tejada, H. B., 2007, Effects of Ag Content on Fracture Resistance of Sn-Ag-Cu Lead-Free Solders Under High-Strain Rate Conditions., Mater. Sci. Eng., pp. 595-603. (Pubitemid 46593846)
-
(2007)
Materials Science and Engineering A
, vol.460-461
, pp. 595-603
-
-
Suh, D.1
Kim, D.W.2
Liu, P.3
Kim, H.4
Weninger, J.A.5
Kumar, C.M.6
Prasad, A.7
Grimsley, B.W.8
Tejada, H.B.9
-
29
-
-
0037463944
-
Effect of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
-
10.1016/S0925-8388(02)01166-0
-
Kim, K. S., Huh, S. H., and Suganuma, K., 2003, Effect of Intermetallic Compounds on Properties of Sn-Ag-Cu Lead-Free Soldered Joints., J. Alloys Compd., 352, pp. 226-236. 10.1016/S0925-8388(02)01166-0
-
(2003)
J. Alloys Compd.
, vol.352
, pp. 226-236
-
-
Kim, K.S.1
Huh, S.H.2
Suganuma, K.3
-
30
-
-
33646390119
-
Effect of Ag content on the microstructure development of Sn-Ag-Cu interconnects
-
DOI 10.1007/s10854-006-6758-y
-
Lu, H. Y., Balkan, H., and Simon Ng, K. Y., 2006, Effect of Ag Content on the Microstructure Development of Sn-Ag-Cu Interconnects., Mater. Electron., 17, pp. 171-188. 10.1007/s10854-006-6758-y (Pubitemid 43676288)
-
(2006)
Journal of Materials Science: Materials in Electronics
, vol.17
, Issue.3
, pp. 171-188
-
-
Lu, H.Y.1
Balkan, H.2
Ng, K.Y.S.3
|