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Finite element analysis of Solder Ball Connect (SBC) structural design optimization
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A full-scale 3D finite element Analysis for no-underfill flip chip package
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Hsu, S.-M.1
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Application of incompatible mesh in three-dimensional analysis of flip-chip ball grid array assembly
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Solder joint reliability modeling for a 540 I/O plastic ball-grid-array assembly
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Denver, CO
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Finite element modeling of BGA packages for life prediction
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Las Vegas, NV
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Gustafsson, G.1
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Comprehensive solder fatigue and thermal characterization of a silicon based multi-chip module package utilizing finite element analysis methodologies
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Pittsburgh, PA
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Zahn, B. A., 2000, "Comprehensive Solder Fatigue and Thermal Characterization of a Silicon Based Multi-chip Module Package Utilizing Finite Element Analysis Methodologies," Proc. 9th Int. ANSYS Conf. Exhib., Pittsburgh, PA.
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Interfacial delamination near solder bumps and UBM in flip-chip packages
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Gu, Y.1
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Reliability modeling for ball grid array assembly with a large number of warpage affected solder joints
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On solution schemes for time-independent thermomechanical analysis for structures containing polymeric materials
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in press
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Lai, Y.-S.1
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Rate dependent constitutive relations based on anand model for 92.5Pb5Sn2.5Ag solder
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Verification of submodeling technique in thermomechanical reliability assessment of flip-chip package assembly
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McGraw-Hill, New York
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Lau, J. H., and Pao, Y.-H., 1997, Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies, McGraw-Hill, New York.
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Solder Joint Reliability of BGA, CSP, Flip Chip, and Fine Pitch SMT Assemblies
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Lau, J.H.1
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0029218601
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Temperature dependent mechanical behavior of plastic packaging materials
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Las Vegas, NV
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Darveaux, R.1
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0038480111
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Effect of simulation methodology on solder joint crack growth correlation and fatigue life prediction
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Darveaux, R., 2002, "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation and Fatigue Life Prediction," ASME J. Electron. Packag. 124(3), pp. 147-154.
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Darveaux, R.1
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Impact of ball via configurations on solder joint reliability in tape based chip-scale packages
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Las Vegas, NV
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Zahn, B. A., 2002, "Impact of Ball Via Configurations on Solder Joint Reliability in Tape Based Chip-scale Packages", Proc. 52nd Electr. Comp. Technol. Conf., Las Vegas, NV, pp. 1475-1483.
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Zahn, B.A.1
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