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Volumn 127, Issue 2, 2005, Pages 135-140

Submodeling analysis for path-dependent thermomechanical problems

Author keywords

[No Author keywords available]

Indexed keywords

BOUNDARY CONDITIONS; COMPUTER SIMULATION; COST EFFECTIVENESS; FINITE ELEMENT METHOD; NUMERICAL ANALYSIS; PROBLEM SOLVING; SOLDERING ALLOYS; SOLUTIONS; THERMAL EFFECTS; THERMOMECHANICAL TREATMENT;

EID: 22944455854     PISSN: 10437398     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.1869513     Document Type: Article
Times cited : (24)

References (18)
  • 1
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    • (1994) IBM J. Res. Dev. , vol.37 , Issue.5 , pp. 585-596
    • Corbin, J.S.1
  • 3
    • 15744397094 scopus 로고    scopus 로고
    • Application of incompatible mesh in three-dimensional analysis of flip-chip ball grid array assembly
    • Kaohsiung, Taiwan
    • Kao, C.-L., Lai, Y.-S., and Wu, J.-D., 2003, "Application of Incompatible Mesh in Three-dimensional Analysis of Flip-chip Ball Grid Array Assembly," Proc. MAPS Taiwan Tech. Symp. 2003, Kaohsiung, Taiwan, pp. 230-235.
    • (2003) Proc. MAPS Taiwan Tech. Symp. 2003 , pp. 230-235
    • Kao, C.-L.1    Lai, Y.-S.2    Wu, J.-D.3
  • 6
    • 0009556433 scopus 로고    scopus 로고
    • Comprehensive solder fatigue and thermal characterization of a silicon based multi-chip module package utilizing finite element analysis methodologies
    • Pittsburgh, PA
    • Zahn, B. A., 2000, "Comprehensive Solder Fatigue and Thermal Characterization of a Silicon Based Multi-chip Module Package Utilizing Finite Element Analysis Methodologies," Proc. 9th Int. ANSYS Conf. Exhib., Pittsburgh, PA.
    • (2000) Proc. 9th Int. ANSYS Conf. Exhib.
    • Zahn, B.A.1
  • 7
    • 0038414268 scopus 로고    scopus 로고
    • Interfacial delamination near solder bumps and UBM in flip-chip packages
    • Gu, Y., Nakamura, T., Chen, W. T., and Cotterell, B., 2001, "Interfacial Delamination Near Solder Bumps and UBM in Flip-chip Packages," ASME J. Electron. Packag., 123(3), pp. 295-301.
    • (2001) ASME J. Electron. Packag. , vol.123 , Issue.3 , pp. 295-301
    • Gu, Y.1    Nakamura, T.2    Chen, W.T.3    Cotterell, B.4
  • 8
    • 0042872381 scopus 로고    scopus 로고
    • Reliability modeling for ball grid array assembly with a large number of warpage affected solder joints
    • Chan, Y. W., Ju, T. H., Hareb, S. A., and Lee, Y. C., 2002, "Reliability Modeling for Ball Grid Array Assembly with a Large Number of Warpage Affected Solder Joints," ASME J. Electron. Packag., 124(3), pp. 246-253.
    • (2002) ASME J. Electron. Packag. , vol.124 , Issue.3 , pp. 246-253
    • Chan, Y.W.1    Ju, T.H.2    Hareb, S.A.3    Lee, Y.C.4
  • 11
    • 85199247500 scopus 로고    scopus 로고
    • On solution schemes for time-independent thermomechanical analysis for structures containing polymeric materials
    • in press
    • Lai, Y.-S., 2005, "On Solution Schemes for Time-Independent Thermomechanical Analysis for Structures Containing Polymeric Materials," Microelectron. Reliab., in press.
    • (2005) Microelectron. Reliab.
    • Lai, Y.-S.1
  • 12
    • 0034238543 scopus 로고    scopus 로고
    • Rate dependent constitutive relations based on anand model for 92.5Pb5Sn2.5Ag solder
    • Wilde, J., Becker, K., Thoben, M., Blum, W., Jupitz, T., Wang, G, and Cheng, Z. N., 2000, "Rate Dependent Constitutive Relations Based on Anand Model for 92.5Pb5Sn2.5Ag Solder," IEEE Trans. Adv. Packag., 23(3), pp. 408-414.
    • (2000) IEEE Trans. Adv. Packag. , vol.23 , Issue.3 , pp. 408-414
    • Wilde, J.1    Becker, K.2    Thoben, M.3    Blum, W.4    Jupitz, T.5    Wang, G.6    Cheng, Z.N.7
  • 14
    • 15744368569 scopus 로고    scopus 로고
    • Verification of submodeling technique in thermomechanical reliability assessment of flip-chip package assembly
    • Lai, Y.-S., and Wang, T. H., 2004, "Verification of Submodeling Technique in Thermomechanical Reliability Assessment of Flip-chip Package Assembly," Microelectron. Reliab., 45(3-4), pp. 575-582.
    • (2004) Microelectron. Reliab. , vol.45 , Issue.3-4 , pp. 575-582
    • Lai, Y.-S.1    Wang, T.H.2
  • 16
    • 0029218601 scopus 로고
    • Temperature dependent mechanical behavior of plastic packaging materials
    • Las Vegas, NV
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    • Darveaux, R.1    Norton, L.2    Camey, F.3
  • 17
    • 0038480111 scopus 로고    scopus 로고
    • Effect of simulation methodology on solder joint crack growth correlation and fatigue life prediction
    • Darveaux, R., 2002, "Effect of Simulation Methodology on Solder Joint Crack Growth Correlation and Fatigue Life Prediction," ASME J. Electron. Packag. 124(3), pp. 147-154.
    • (2002) ASME J. Electron. Packag. , vol.124 , Issue.3 , pp. 147-154
    • Darveaux, R.1
  • 18
    • 0036297303 scopus 로고    scopus 로고
    • Impact of ball via configurations on solder joint reliability in tape based chip-scale packages
    • Las Vegas, NV
    • Zahn, B. A., 2002, "Impact of Ball Via Configurations on Solder Joint Reliability in Tape Based Chip-scale Packages", Proc. 52nd Electr. Comp. Technol. Conf., Las Vegas, NV, pp. 1475-1483.
    • (2002) Proc. 52nd Electr. Comp. Technol. Conf. , pp. 1475-1483
    • Zahn, B.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.