Analysis of clamped inductive turnoff failure in railway traction IGBT power modules under overload conditions

IEEE Transactions on Industrial Electronics

Volumn 58, Issue 7, 2011, Pages 2706-2714

  Perpiña, Xavier ^a   Serviere, Jean Franois ^b   Urresti Ibanez, Jesús ^a   Cortés, Ignasi ^a   Jordà, Xavier ^a   Hidalgo, Salvador ^a   Rebollo, Jose ^a   Mermet Guyennet, Michel ^a  

^a UNIVERSITAT AUTÒNOMA DE BARCELONA   (Spain)

^b ALSTOM   (France)

Author keywords

Insulated gate bipolar transistor (IGBT) power module; power inverter reliability; railway applications; semiconductor device breakdown; semiconductor device thermal factors

Indexed keywords

INSULATED-GATE BIPOLAR TRANSISTOR (IGBT) POWER MODULE; POWER INVERTERS; RAILWAY APPLICATIONS; SEMICONDUCTOR DEVICE BREAKDOWN; SEMICONDUCTOR DEVICE THERMAL FACTORS;

ELECTRIC POWER SYSTEMS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); MULTICHIP MODULES; RAILROADS; RELIABILITY ANALYSIS; SEMICONDUCTOR SWITCHES; TRACTION (FRICTION); TRANSISTORS;

ACTIVE FILTERS;

EID: 79959289978     PISSN: 02780046     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIE.2010.2077613     Document Type: Article

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