Failure-relevant abnormal events in power inverters considering measured IGBT module temperature inhomogeneities

Microelectronics Reliability

Volumn 47, Issue 9-11 SPEC. ISS., 2007, Pages 1784-1789

  Perpina X ^a   Castellazzi, A ^b   Piton, M ^a   Mermet Guyennet, M ^a   Millan J ^c  

^a ALSTOM   (France)

^b ETH ZURICH   (Switzerland)

^c INSTITUTO DE MICROELECTRÓNICA DE BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COOLING SYSTEMS; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT;

ELECTRO-THERMAL SIMULATIONS; POWER MODULES; THERMAL DESIGN;

ELECTRIC INVERTERS;

EID: 34548677751     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.07.071     Document Type: Article

References (11)

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