Use of accurate chip level modeling and analysis of a power module to establish reliability rules

IEEE International Symposium on Industrial Electronics

Volumn 2, Issue , 2006, Pages 1571-1576

  De Maglie, R ^a,b   Lourdel, G ^b   Austin, P ^a   Dienot, J M ^c   Schanen, J L ^d   Sanchez, J L ^a  

^a LAAS CNRS   (France)

^b Power Electronics Associated Research Laboratory   (France)

^c LESIA   (France)

^d LABORATOIRE D ELECTROTECHNIQUE DE GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FILTERS; ELECTRIC CONDUCTIVITY; INDUSTRIAL ELECTRONICS; INSULATED GATE BIPOLAR TRANSISTORS (IGBT); RELIABILITY; RELIABILITY ANALYSIS; SEMICONDUCTING INDIUM; SEMICONDUCTOR MATERIALS;

CHIP-LEVEL; COUPLING PHENOMENON; ELECTRICAL BEHAVIORS; INTERNATIONAL SYMPOSIUM; MODELING AND ANALYSIS; MODELING APPROACHES; POWER MODULES; SIMULATION APPROACH; SIMULATION METHODOLOGY;

ELECTRIC NETWORK ANALYSIS;

EID: 53649087979     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISIE.2006.295706     Document Type: Conference Paper

References (6)

1. G. Bonnet, P. Austin, J.-L. Sanchez, "New distributed model of IGBT NPT dedicated to power circuits design." Microelectronics reliability, vol. 44, issue 1, January 2004, pp. 79-88.
2. L. Mussard, P. Tounsi, P. Austin, G. Bonnet, J.-M. Dorkel, J. Saiz, "Power component models with thermally dependent parameters for circuit simulator." 10th European Conference on Power Electronics and Applications (EPE'2003), Toulouse (France), 2-4 September 2003, 11p.
3. R. De Maglie, P. Austin, L. Mussard, J.-L. Sanchez, M. Elghazouani, F. Richardeau, J.-L. Schanen, "Trench IGBT distributed model with thermo-sensible parameters." 11th European Conference on Power Electronics and Applications (EPE'2005), Dresden (Germany), 11-14 September 2005, 12p.
4. G. Gillet, M. Kallala, J.-L. Massol, Ph. Leturcq. "Analog solution of the ambipolar diffusion equation." C.R. Acad. Sc. Paris, t.321, Serie II b, 1995, pp.53-59.
5. G. Lourdel, J.M. Dienot, "Study, design and validation of an integrated close field-probe system for EMC investigations on a power hybrid structure." IEEE EMC Symposium, Santa Clara (CA), IEEE publisher (August 2004).
6. Ansoft™ Software, www.ansoft.com.