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Volumn 47, Issue 9-11 SPEC. ISS., 2007, Pages 1779-1783

Thermal fatigue effects on the temperature distribution inside IGBT modules for zone engine aeronautical applications

Author keywords

[No Author keywords available]

Indexed keywords

AEROSPACE ENGINEERING; SOLDERING ALLOYS; TEMPERATURE DISTRIBUTION; THERMAL FATIGUE;

EID: 34548736004     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2007.07.093     Document Type: Article
Times cited : (19)

References (8)
  • 1
    • 34548736772 scopus 로고    scopus 로고
    • Lhommeau T, Meuret R, Karama M. Technological study of a module IGBT for an aeronautical application in zone engine. In: Proceedings of EPE, Dresden, Germany; 2005.
  • 2
    • 34548796734 scopus 로고    scopus 로고
    • Hamidi A, Coquery G, Lallemand R. Reliability of high power IGBT modules - testing on thermal fatigue effects due to traction cycles. In: Proceedings of EPE; 1997. p. 3118-23.
  • 3
    • 2442527850 scopus 로고    scopus 로고
    • Boundary element analysis of thermal fatigue effects on high power IGBT modules
    • Khatir Z., and Lefebvre S. Boundary element analysis of thermal fatigue effects on high power IGBT modules. Microelectron Reliab 44 (2004) 929-938
    • (2004) Microelectron Reliab , vol.44 , pp. 929-938
    • Khatir, Z.1    Lefebvre, S.2
  • 4
    • 84971413291 scopus 로고    scopus 로고
    • Dupont L, Khatir Z, Lefebvre S, Bontemps S. Evaluation of substrate technologies under high temperature cycling. In: Proceedings of CIPS, Naples, Italy; 2006.
  • 5
    • 0036287853 scopus 로고    scopus 로고
    • Hayashi K, Izuta G, Murakami K, Uegai Y, Takao H. Improvement of fatigue life of solder joints by thickness control of solder with wire bump technique. In: Proceedings of ECTC, San Diego, USA; 2002. p. 1469-74.
  • 6
    • 0024684623 scopus 로고
    • Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards
    • Engelmaier W., and Attarwala A.I. Surface-mount attachment reliability of clip-leaded ceramic chip carriers on FR-4 circuit boards. IEEE Trans Compon Hybr Manufact Technol 12 (1980) 284-296
    • (1980) IEEE Trans Compon Hybr Manufact Technol , vol.12 , pp. 284-296
    • Engelmaier, W.1    Attarwala, A.I.2
  • 7
    • 33847121320 scopus 로고    scopus 로고
    • Déplanque S, Nüchter W, Wunderle B, Schacht R, Michel B. Lifetime prediction of SnPb and SnAgCu solder joints of chips on copper substrate based on crack propagation FE-Analysis. In: Proceedings of EUROSIME, Milano, Italy; 2006.
  • 8
    • 51049102536 scopus 로고    scopus 로고
    • Fradin JP, Molla L, Desaunettes B. Analysis of 3D conjugate heat transfer in electronics. In: Proceedings of ED&TC, Paris, France; 1997. p. 1066-409.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.