Problems related to the avalanche and secondary breakdown of silicon p-n junction

Microelectronics Reliability

Volumn 37, Issue 5, 1997, Pages 713-719

  Puritis, T ^a  

^a RIGA TECHNICAL UNIVERSITY   (Latvia)

Author keywords

[No Author keywords available]

Indexed keywords

AVALANCHE DIODES; CHARGE CARRIERS; ELECTRIC BREAKDOWN; ELECTRIC CURRENTS; HEATING; LIGHT; MATHEMATICAL MODELS; SEMICONDUCTING SILICON;

GRIBNIKOV MODEL; MESOPLASMA; RIDELY MODEL; SECONDARY BREAKDOWN; SHOCKLEY MODEL; WOLF DIFFUSION MODEL;

SEMICONDUCTOR JUNCTIONS;

EID: 0031148194     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(96)00252-1     Document Type: Article

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