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Applied Physics Letters

Volumn 98, Issue 22, 2011, Pages

An observation of charge trapping phenomena in GaN/AlGaN/ Gd2 O3 /Ni-Au structure

(6) Chang, Liann Be a Das, Atanu a Lin, Ray Ming a Maikap, Siddheswar a Jeng, Ming Jer a Chou, Shu Tsun a

a CHANG GUNG UNIVERSITY (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

AMBIENT AIR; CHARGE LOSS; ELECTRON TRAPPING; FABRICATED STRUCTURES; MEMORY WINDOW; METAL OXIDE SEMICONDUCTOR STRUCTURES; NEGATIVE BIAS; PROGRAMMING PULSE; TIME DEPENDENT;

C (PROGRAMMING LANGUAGE); CHARGE TRAPPING; GOLD COATINGS;

GADOLINIUM;

EID: 79958853039 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3596382 Document Type: Article

Times cited : (16)

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