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Thin Solid Films

Volumn 519, Issue 18, 2011, Pages 5996-5999

X-ray microdiffraction from α-Ti0.04Fe 1.96O3 (0001) epitaxial film grown over α-Cr 2O3 buffer layer boundary

(1) Kim, Chang Yong a

a CANADIAN LIGHT SOURCE INC (Canada)

Author keywords

Hematite; Thin film; X ray microdiffraction

Indexed keywords

CONCENTRATION VARIATION; FILM GROWTH MODE; LAYER BOUNDARIES; OXYGEN PLASMA-ASSISTED MOLECULAR-BEAM EPITAXY; STRAIN-RELAXED; SYNCHROTRON X RAYS; X RAY MICRODIFFRACTION;

BUFFER LAYERS; DIFFRACTION; EPITAXIAL FILMS; EPITAXIAL GROWTH; HEMATITE; IRON ORES; MOLECULAR BEAM EPITAXY; MOLECULAR BEAMS; MOLECULAR OXYGEN; SUBSTRATES; X RAY DIFFRACTION; X RAYS;

FILM GROWTH;

EID: 79958169787 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.03.130 Document Type: Article

Times cited : (2)

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