Dislocation network driven structural relaxation in hematite thin films

Materials Science and Engineering: B

Volumn 144, Issue 1-3, 2007, Pages 19-22

  Barbier, A ^a   Bezencenet, O ^a   Mocuta, C ^b   Moussy, J B ^a   Magnan, H ^a   Jedrecy, N ^c   Guittet, M J ^a   Gautier Soyer, M ^a  

^a CEA SACLAY   (France)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c INSTITUT DES NANOSCIENCES DE PARIS   (France)

Author keywords

Dislocation network; Hematite; Relaxation; Surface X ray diffraction

Indexed keywords

HEMATITE; IRON COMPOUNDS; MOLECULAR BEAM EPITAXY; OXYGEN; PARAMETER ESTIMATION; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

DISLOCATION NETWORK; LATTICE PARAMETER; PARASITIC CONTRIBUTIONS; PLANE ROTATION;

THIN FILMS;

EID: 36048994262     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.07.083     Document Type: Article

References (20)

1. Freund H.-J., Kuhlenbeck H., and Staemmler V. Rep. Prog. Phys. 59 (1996) 283
2. Henry C.R. Surf. Sci. Rep. 31 (1998) 231
3. Al-Abadleh H.A., and Grassian V.H. Surf. Sci. Rep. 52 (2003) 63
4. Reddy B.V., and Khanna S.N. Phys. Rev. Lett. 93 (2005) 068301
5. Morrish A.H. Canted Antiferromagnetism: Hematite (1994), Singapore, World Scientific
6. Kim Y.J., Gao Y., and Chambers S.A. Surf. Sci. 371 (1997) 358
7. Gao Y., and Chambers S.A. J. Cryst. Growth 174 (1997) 446
8. Gota S., Moussy J.B., Henriot M., Guittet M.J., and Gautier-Soyer M. Surf. Sci. 482-485 (2001) 809
9. Barbier A., Belkhou R., Ohresser P., Gautier-Soyer M., Bezencenet O., Mulazzi M., Guittet M.-J., and Moussy J.-B. Phys. Rev. B 72 (2005) 245423
10. Weiß W. Surf. Sci. 377-379 (1997) 943
11. Weiss W., and Ritter M. Phys. Rev. B 59 (1999) 5201
12. Farrow R.F.C. J. Cryst. Growth 133 (1993) 47
13. Gota S., Guiot E., Henriot M., and Gautier-Soyer M. Phys. Rev. B 60 (1999) 14387
14. van der Merwe J.H. Philos. Mag. A 45 (1982) 127
15. Kirfel A., and Eichhorn K. Acta Crystallogr., Sect. A 46 (1990) 271
16. Blake R.L., Hessevick R.E., Zoltai T., and Finger L.W. Am. Miner. 51 (1966) 123
17. Grübel G., Huang K.G., Gibbs D., Zehner D.M., Sandy A.R., and Mochrie S.G.J. Phys. Rev. B 48 (1993) 18119
18. Renaud G., Guenard P., and Barbier A. Phys. Rev. B 58 (1998) 7310
19. Poor quality is meant with respect to the X-ray diffraction criterions. The film remains mainly single crystalline.
20. P. Bayle-Guillemaud, CEA/Grenoble, unpublished data.