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Volumn 71, Issue 16, 1997, Pages 2259-2261

Defect structure in selectively grown GaN films with low threading dislocation density

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EID: 0000586939 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.120044 Document Type: Article

Times cited : (427)

References (14)

1
- 0029779805
- S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Yamada, T. Matsushima, H. Kiyoku, and Y. Sugimoto, Jpn. J. Appl. Phys., Part 2 35, L74 (1996).
- (1996) Jpn. J. Appl. Phys., Part 2 , vol.35
- Nakamura, S.¹ Senoh, M.² Nagahama, S.³ Iwasa, N.⁴ Yamada, T.⁵ Matsushima, T.⁶ Kiyoku, H.⁷ Sugimoto, Y.⁸

2
- 0030572215
- I. Akasaki, S. Sota, H. Sakai, T. Tanaka, M. Koike, and H. Amano, Electron. Lett. 32, 1105 (1996).
- (1996) Electron. Lett. , vol.32 , pp. 1105
- Akasaki, I.¹ Sota, S.² Sakai, H.³ Tanaka, T.⁴ Koike, M.⁵ Amano, H.⁶

3
- 0030264202
- K. Itaya, M. Onomura, J. Nishino, L. Surgiura, S. Saito, M. Suzuki, J. Rennie, S. Nunoue, M. Yamamoto, H. Fujimoto, Y. Kokubun, Y. Ohba, G. Hatakoshi, and M. Ishikawa, Jpn. J. Appl. Phys., Part 2 35, L1315 (1996).
- (1996) Jpn. J. Appl. Phys., Part 2 , vol.35
- Itaya, K.¹ Onomura, M.² Nishino, J.³ Surgiura, L.⁴ Saito, S.⁵ Suzuki, M.⁶ Rennie, J.⁷ Nunoue, S.⁸ Yamamoto, M.⁹ Fujimoto, H.¹⁰ Kokubun, Y.¹¹ Ohba, Y.¹² Hatakoshi, G.¹³ Ishikawa, M.¹⁴

4
- 0029637531
- S. D. Lester, F. A. Ponce, M. G. Craford, and D. A. Steigerwald, Appl. Phys. Lett. 66, 1249 (1995).
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1249
- Lester, S.D.¹ Ponce, F.A.² Craford, M.G.³ Steigerwald, D.A.⁴

5
- 36449000214
- R. C. Powell, N.-E. Lee, and J. E. Greene, Appl. Phys. Lett. 60, 2505 (1992).
- (1992) Appl. Phys. Lett. , vol.60 , pp. 2505
- Powell, R.C.¹ Lee, N.-E.² Greene, J.E.³

6
- 36448998638
- W. Qian, M. Skowronski, M. De Graef, K. Doverspike, L. B. Rowland, and D. K. Gaskill, Appl. Phys. Lett. 66, 1252 (1995).
- (1995) Appl. Phys. Lett. , vol.66 , pp. 1252
- Qian, W.¹ Skowronski, M.² De Graef, M.³ Doverspike, K.⁴ Rowland, L.B.⁵ Gaskill, D.K.⁶

7
- 0030108963
- X. J. Ning, F. R. Chien, P. Pirouz, J. W. Yang, and M. Asif Khan, J. Mater. Res. 11, 580 (1996).
- (1996) J. Mater. Res. , vol.11 , pp. 580
- Ning, X.J.¹ Chien, F.R.² Pirouz, P.³ Yang, J.W.⁴ Asif Khan, M.⁵

8
- 0000392520
- X. H. Wu, L. M. Brown, D. Kapolnek, S. Keller, B. Keller, S. P. DenBaars, and J. S. Speck, J. Appl. Phys. 80, 3228 (1996).
- (1996) J. Appl. Phys. , vol.80 , pp. 3228
- Wu, X.H.¹ Brown, L.M.² Kapolnek, D.³ Keller, S.⁴ Keller, B.⁵ DenBaars, S.P.⁶ Speck, J.S.⁷

9
- 22244476386
- S. Keller, B. P. Keller, Y.-E. Wu, B. Keying, D. Kapolnek, J. S. Speck, U. K. Mishra, and S. P. DenBaars, Appl. Phys. Lett. 68, 1525 (1996).
- (1996) Appl. Phys. Lett. , vol.68 , pp. 1525
- Keller, S.¹ Keller, B.P.² Wu, Y.-E.³ Keying, B.⁴ Kapolnek, D.⁵ Speck, J.S.⁶ Mishra, U.K.⁷ DenBaars, S.P.⁸

10
- 0019530401
- S. Yamakoshi, M. Abe, O. Wada, S. Komiya, and T. Sakurai, IEEE J. Quantum Electron. QE-17, 167 (1981).
- (1981) IEEE J. Quantum Electron. , vol.QE-17 , pp. 167
- Yamakoshi, S.¹ Abe, M.² Wada, O.³ Komiya, S.⁴ Sakurai, T.⁵

11
- 0015299976
- A. H. Herzog, D. L. Keune, and M. G. Craford, J. Appl. Phys. 43, 600 (1972).
- (1972) J. Appl. Phys. , vol.43 , pp. 600
- Herzog, A.H.¹ Keune, D.L.² Craford, M.G.³

12
- 0346883671
- O. Ueda, K. Wakao, A. Yamaguchi, S. Isozumi, and S. Komiya, J. Appl. Phys. 57, 1523 (1985).
- (1985) J. Appl. Phys. , vol.57 , pp. 1523
- Ueda, O.¹ Wakao, K.² Yamaguchi, A.³ Isozumi, S.⁴ Komiya, S.⁵

13
- 0031187047
- A. Usui, H. Sunakawa, A. Sakai, and A. A. Yamaguchi, Jpn. J. Appl. Phys., Part 2 36, L899 (1997).
- (1997) Jpn. J. Appl. Phys., Part 2 , vol.36
- Usui, A.¹ Sunakawa, H.² Sakai, A.³ Yamaguchi, A.A.⁴

14
- 0003598030
- Butterworths, London
- P. B. Hirsch, A. Howie, R. B. Nicholson, D. W. Pashley, and M. J. Whelan, Electron Microscopy of Thin Crystals (Butterworths, London, 1965).
- (1965) Electron Microscopy of Thin Crystals
- Hirsch, P.B.¹ Howie, A.² Nicholson, R.B.³ Pashley, D.W.⁴ Whelan, M.J.⁵

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