Quantitative analysis of layering and in-plane structural ordering at an alumina-aluminum solid-liquid interface

Acta Materialia

Volumn 59, Issue 11, 2011, Pages 4378-4386

  Kauffmann, Y ^a   Oh, S H ^b,d   Koch, C T ^b   Hashibon, A ^e   Scheu, C ^c   Ruhle M ^b   Kaplan, W D ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^c UNIVERSITY OF MUNICH   (Germany)

^d Pohang University of Science and Technology (POSTECH)   (South Korea)

^e FRAUNHOFER INSTITUTE FOR MECHANICS OF MATERIALS IWM   (Germany)

Author keywords

Atomic ordering; High resolution transmission electron microscopy; In line holography; Solid liquid interface; Structural correlation length

Indexed keywords

ALUMINA; ALUMINUM; ALUMINUM OXIDE; ATOMS; CRYSTAL ATOMIC STRUCTURE; ELECTRON MICROSCOPY; EXTRACTION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGE PROCESSING; IMAGE RESOLUTION; IMAGING SYSTEMS; ITERATIVE METHODS; LIQUIDS; NUMERICAL METHODS; WAVE FUNCTIONS;

ATOMIC ORDERING; FUNCTION RECONSTRUCTION; IN-LINE HOLOGRAPHY; LIQUID-SOLID INTERFACES; QUANTITATIVE INFORMATION; SOLID-LIQUID INTERFACES; STRUCTURAL CORRELATION; STRUCTURAL INFORMATION;

PHASE INTERFACES;

EID: 79955985757     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2011.03.061     Document Type: Article

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