-
1
-
-
0029227908
-
-
Merkle K.L. Boston: Kluwer
-
Merkle K.L. Interface Science. Vol. 2:1995;311-345 Kluwer, Boston.
-
(1995)
Interface Science
, vol.2
, pp. 311-345
-
-
-
2
-
-
0031918214
-
-
Möbus G., Schweinfest R., Gemming T., Wagner T., Rühle M. J. Microsc. 190:1998;109-130.
-
(1998)
J. Microsc.
, vol.190
, pp. 109-130
-
-
Möbus, G.1
Schweinfest, R.2
Gemming, T.3
Wagner, T.4
Rühle, M.5
-
3
-
-
85151263989
-
-
King W.E., Cambell G.H., Foiles S.M., Cohen D., Hanson K.M. J. Microsc. 190:1998;131-143.
-
(1998)
J. Microsc.
, vol.190
, pp. 131-143
-
-
King, W.E.1
Cambell, G.H.2
Foiles, S.M.3
Cohen, D.4
Hanson, K.M.5
-
6
-
-
4243848273
-
-
Yan Y., Chisholm M.F., Duscher G., Matti A., Pennycook S.J., Pantelides S.T. Phys. Rev. Lett. 81:1998;3675-3678.
-
(1998)
Phys. Rev. Lett.
, vol.81
, pp. 3675-3678
-
-
Yan, Y.1
Chisholm, M.F.2
Duscher, G.3
Matti, A.4
Pennycook, S.J.5
Pantelides, S.T.6
-
17
-
-
0031275955
-
-
Zimnol M., Graff A., Sieber H., Senz S., Schmidt S., Mattheis R., Hesse D. Solid State Ionics. 101-103:1997;667-672.
-
(1997)
Solid State Ionics
, vol.101-103
, pp. 667-672
-
-
Zimnol, M.1
Graff, A.2
Sieber, H.3
Senz, S.4
Schmidt, S.5
Mattheis, R.6
Hesse, D.7
-
24
-
-
0021601720
-
Improved high resolution image processing of bright field electron micrographs. I. Theory
-
Kirkland E.J. Improved high resolution image processing of bright field electron micrographs. I. Theory. Ultramicroscopy. 15:1984;151-172.
-
(1984)
Ultramicroscopy
, vol.15
, pp. 151-172
-
-
Kirkland, E.J.1
-
27
-
-
0003641364
-
-
A. et al. Tonomura. Amsterdam: North Holland-Elsevier. ISBN 0-444-82051-5
-
Op de Beeck M., Van Dyck D., Coene W. Tonomura A., et al. Electron Holography. 1995;307-316 North Holland-Elsevier, Amsterdam. ISBN 0-444-82051-5.
-
(1995)
Electron Holography
, pp. 307-316
-
-
Op De Beeck, M.1
Van Dyck, D.2
Coene, W.3
-
30
-
-
0003857503
-
-
J.R. Andersson, Boudart M. Berlin: Springer
-
Topsoe H., Clausen B.S., Massoth E.E. Andersson J.R., Boudart M. Catalysis, Science and Technology. Vol. 11:1996;Springer, Berlin.
-
(1996)
Catalysis, Science and Technology
, vol.11
-
-
Topsoe, H.1
Clausen, B.S.2
Massoth, E.E.3
-
33
-
-
0031124138
-
-
Graboy I.E., Markov N.V., Maleev V.V., Kaul A.R., Polyakov S.N., Svetchnikov V.L., Zandbergen H.W., Dahmen K.H. J. Alloys Compd. 251:1997;318.
-
(1997)
J. Alloys Compd.
, vol.251
, pp. 318
-
-
Graboy, I.E.1
Markov, N.V.2
Maleev, V.V.3
Kaul, A.R.4
Polyakov, S.N.5
Svetchnikov, V.L.6
Zandbergen, H.W.7
Dahmen, K.H.8
-
41
-
-
0031895773
-
-
Gemming T., Möbus G., Exner M., Ernst F., Rühle M. J. Microsc. 190:1998;89-98.
-
(1998)
J. Microsc.
, vol.190
, pp. 89-98
-
-
Gemming, T.1
Möbus, G.2
Exner, M.3
Ernst, F.4
Rühle, M.5
-
42
-
-
0030221538
-
-
Tang D., Zandbergen H.W., Jansen J., Op de Beeck M., van Dyck D. Ultramicroscopy. 64:1996;265-276.
-
(1996)
Ultramicroscopy
, vol.64
, pp. 265-276
-
-
Tang, D.1
Zandbergen, H.W.2
Jansen, J.3
Op De Beeck, M.4
Van Dyck, D.5
-
43
-
-
0343338426
-
-
Van Dyck D., Op de Beeck M., Tang D., Jansen J., Zandbergen H.W. IEEE Int. Conf. on Image Processing, Los Alamitos :1996;737-770.
-
(1996)
IEEE Int. Conf. on Image Processing, Los Alamitos
, pp. 737-770
-
-
Van Dyck, D.1
Op De Beeck, M.2
Tang, D.3
Jansen, J.4
Zandbergen, H.W.5
-
46
-
-
0343338431
-
-
Bokel R.M.J., Jansen J., Zandbergen H.W., Van Dyck D. Proc. 14th Int. Congress on Electron Microscopy, Cancun, Mexico. Vol. II:1998;407.
-
(1998)
Proc. 14th Int. Congress on Electron Microscopy, Cancun, Mexico
, vol.2
, pp. 407
-
-
Bokel, R.M.J.1
Jansen, J.2
Zandbergen, H.W.3
Van Dyck, D.4
|