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Volumn 131, Issue 1, 2000, Pages 35-49

Exit wave reconstructions of surfaces and interfaces using through focus series of HREM images

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; CERIUM COMPOUNDS; HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE RECONSTRUCTION; INTERFACES (MATERIALS); MOLYBDENUM COMPOUNDS; NICKEL COMPOUNDS; SAPPHIRE; SURFACE STRUCTURE;

EID: 0033707969     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(00)00620-2     Document Type: Article
Times cited : (3)

References (46)
  • 1
    • 0029227908 scopus 로고
    • Merkle K.L. Boston: Kluwer
    • Merkle K.L. Interface Science. Vol. 2:1995;311-345 Kluwer, Boston.
    • (1995) Interface Science , vol.2 , pp. 311-345
  • 24
    • 0021601720 scopus 로고
    • Improved high resolution image processing of bright field electron micrographs. I. Theory
    • Kirkland E.J. Improved high resolution image processing of bright field electron micrographs. I. Theory. Ultramicroscopy. 15:1984;151-172.
    • (1984) Ultramicroscopy , vol.15 , pp. 151-172
    • Kirkland, E.J.1
  • 27
    • 0003641364 scopus 로고
    • A. et al. Tonomura. Amsterdam: North Holland-Elsevier. ISBN 0-444-82051-5
    • Op de Beeck M., Van Dyck D., Coene W. Tonomura A., et al. Electron Holography. 1995;307-316 North Holland-Elsevier, Amsterdam. ISBN 0-444-82051-5.
    • (1995) Electron Holography , pp. 307-316
    • Op De Beeck, M.1    Van Dyck, D.2    Coene, W.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.