Modelling the atomic density across a solid-liquid interface

Surface Science

Volumn 402-404, Issue , 1998, Pages 866-870

  Huisman, Willem Jan ^a   Van Der Veen, J Friso ^b  

^a FOM INSTITUTE AMOLF   (Netherlands)

^b UNIVERSITY OF AMSTERDAM   (Netherlands)

Author keywords

Diamond; Gallium; Metal semiconductor interfaces; Solid liquid interfaces; Surface structure, morphology and roughness; X ray scattering and reflection

Indexed keywords

ELECTROMAGNETIC WAVE REFLECTION; ELECTROMAGNETIC WAVE SCATTERING; MORPHOLOGY; PHASE INTERFACES; SEMICONDUCTING DIAMONDS; SEMICONDUCTING GALLIUM; SURFACE ROUGHNESS; X RAYS;

ATOMIC DENSITY DISTRIBUTION;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0031634966     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0039-6028(97)01058-3     Document Type: Article

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