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Zeitschrift fuer Metallkunde/Materials Research and Advanced Techniques

Volumn 94, Issue 4, 2003, Pages 358-367

Analysis of mismatched heterointerfaces by combined HREM image processing and modelling

(6) Möbus, Guenter a Levay, A b Inkson, B J a Hytch M J c Trampert, A d Wagner, T e

a UNIVERSITY OF SHEFFIELD (United Kingdom)

b EÖTVÖS LORÁND UNIVERSITY (Hungary)

c CNRS (France)

d PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK (Germany)

e MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS (Germany)

Author keywords

Dislocation networks; Intermetallic alloys; Misfit dislocations; Molecular modelling; Quantitative HREM; Semiconductor interfaces; Strain mapping

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DISLOCATIONS (CRYSTALS); HIGH RESOLUTION ELECTRON MICROSCOPY; IMAGE PROCESSING; INTERMETALLICS; MATHEMATICAL MODELS; STRAIN;

FOURIER SPECTRUM; MISMATCHED HETEROINTERFACES; MOLECULAR MODELING; SEMICONDUCTOR INTERFACES; STRAIN MAPPING;

INTERFACES (MATERIALS);

EID: 1342306260 PISSN: 00443093 EISSN: None Source Type: Journal
DOI: 10.3139/146.030358 Document Type: Article

Times cited : (1)

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