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Volumn 216, Issue 1, 2004, Pages 70-75

Investigation of the effects of partial coherence on exit wave reconstruction

Author keywords

Exit wave reconstruction; Partial coherence; Phase retrieval; Transmission electron microscopy

Indexed keywords

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMAGING SYSTEMS; ITERATIVE METHODS; WAVE FUNCTIONS;

EID: 4744367867     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.0022-2720.2004.01384.x     Document Type: Article
Times cited : (12)

References (14)
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    • Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy
    • Coene, W.M.J., Thust, A., Op de Beeck, M. & Van Dyck, D. (1996) Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy. Ultramicroscopy. 64, 109-135.
    • (1996) Ultramicroscopy , vol.64 , pp. 109-135
    • Coene, W.M.J.1    Thust, A.2    Op De Beeck, M.3    Van Dyck, D.4
  • 4
    • 3042517464 scopus 로고
    • New aspects in nonlinear image processing for high resolution electron microscopy
    • Coene, W. & Van Dyck, D. (1988) New aspects in nonlinear image processing for high resolution electron microscopy. Scanning Microsc. Suppl 2, 117-129.
    • (1988) Scanning Microsc. Suppl. , vol.2 , pp. 117-129
    • Coene, W.1    Van Dyck, D.2
  • 6
    • 0015672282 scopus 로고
    • The envelope of electron microscope transfer functions for partially coherent illumination
    • Frank, J. (1973) The envelope of electron microscope transfer functions for partially coherent illumination. Optik, 38, 519-536.
    • (1973) Optik , vol.38 , pp. 519-536
    • Frank, J.1
  • 7
    • 0018872947 scopus 로고
    • Contrast of crystal images in TEM
    • Ishizuka, K. (1980) Contrast of crystal images in TEM. Ultramicroscopy, 5, 55-65.
    • (1980) Ultramicroscopy , vol.5 , pp. 55-65
    • Ishizuka, K.1
  • 8
    • 0020412169 scopus 로고
    • Nonlinear high resolution image processing of conventional transmission electron micrographs
    • Kirkland, E.J. (1982) Nonlinear high resolution image processing of conventional transmission electron micrographs. Ultramicroscopy, 9, 45-64.
    • (1982) Ultramicroscopy , vol.9 , pp. 45-64
    • Kirkland, E.J.1
  • 11
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    • Recovery of specimen information for strongly scattering objects
    • (ed. by P. W Hawkes). Springer-Verlag, Berlin
    • Saxton, W.O. (1980) Recovery of specimen information for strongly scattering objects. Computer Processing of Electron Microscope Images (ed. by P. W Hawkes), pp. 35 - 87. Springer-Verlag, Berlin.
    • (1980) Computer Processing of Electron Microscope Images , pp. 35-87
    • Saxton, W.O.1
  • 12
    • 0013561941 scopus 로고
    • Calculation of diffraction patterns and images for fast electrons
    • (ed. by P. R. Buseck, J. M. Cowley & L. Eyring). Oxford University Press, New York
    • Self, P.G. & O'Keefe, M.A. (1988) Calculation of diffraction patterns and images for fast electrons. High-Resolution Transmission Electron Microscopy and Associated Techniques (ed. by P. R. Buseck, J. M. Cowley & L. Eyring), pp. 244-307. Oxford University Press, New York.
    • (1988) High-Resolution Transmission Electron Microscopy and Associated Techniques , pp. 244-307
    • Self, P.G.1    O'Keefe, M.A.2
  • 13
    • 0030221970 scopus 로고    scopus 로고
    • Focal-series reconstruction in HRTEM: Simulation studies on non-periodic objects
    • Thust, A., Coene, W.M.J., Op de Beeck, M. & Van Dyck, D. (1996) Focal-series reconstruction in HRTEM: simulation studies on non-periodic objects. Ultramicroscopy, 64, 211-230.
    • (1996) Ultramicroscopy , vol.64 , pp. 211-230
    • Thust, A.1    Coene, W.M.J.2    Op De Beeck, M.3    Van Dyck, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.