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Volumn 64, Issue 1-4, 1996, Pages 185-198

Non-linear interference in relation to strong delocalisation

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTRON MICROSCOPES; IMAGE QUALITY; MICROSCOPES;

EID: 0030222011     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(96)00007-1     Document Type: Article
Times cited : (27)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.