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Volumn 64, Issue 1-4, 1996, Pages 185-198
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Non-linear interference in relation to strong delocalisation
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Author keywords
[No Author keywords available]
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Indexed keywords
ABERRATIONS;
ELECTRON MICROSCOPES;
IMAGE QUALITY;
MICROSCOPES;
SPHERICAL DEFOCUS;
STRONG DELOCALISATION;
LIGHT INTERFERENCE;
ARTICLE;
ELECTRON MICROSCOPY;
HOLOGRAPHY;
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EID: 0030222011
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/0304-3991(96)00007-1 Document Type: Article |
Times cited : (27)
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References (10)
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