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Volumn 29, Issue 2, 2011, Pages

SiN membranes with submicrometer hole arrays patterned by wafer-scale nanosphere lithography

Author keywords

[No Author keywords available]

Indexed keywords

DRY ETCHING; LITHOGRAPHY; MEMBRANES; MICROFILTRATION; NANOSPHERES; POTASSIUM HYDROXIDE; SILICON NITRIDE;

EID: 79953771927     PISSN: 21662746     EISSN: 21662754     Source Type: Journal    
DOI: 10.1116/1.3554404     Document Type: Article
Times cited : (23)

References (31)
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    • edited by Y. Fujisaki, R. Waser, T. Li, and C. Bonafos (Materials Research Society, Warrendale)
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    • Diaz, R.1
  • 19
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    • The intrinsic stress values were provided by the Center of Micro- and Nanotechnology at the Ecole Polytechnique F́d́rale de Lausanne (EPFL). Si-rich LPCVD and stoichiometric SiN films were deposited using an in-house equipment. Stress measurements were done based on wafer curvature measurements
    • The intrinsic stress values were provided by the Center of Micro- and Nanotechnology at the Ecole Polytechnique F́d́rale de Lausanne (EPFL). Si-rich LPCVD and stoichiometric SiN films were deposited using an in-house equipment. Stress measurements were done based on wafer curvature measurements.
  • 21
    • 0035928129 scopus 로고    scopus 로고
    • Nanosphere lithography: A versatile nanofabrication tool for studies of size-dependent nanoparticle optics
    • DOI 10.1021/jp010657m
    • C. L. Haynes and R. P. Van Duyne, J. Phys. Chem. B 1089-5647 105, 5599 (2001). 10.1021/jp010657m (Pubitemid 35339124)
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    • Haynes, C.L.1    Van Duyne, R.P.2
  • 24
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    • (unpublished)
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    • Elias, H.G.1
  • 25
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    • 0960-1317, 10.1088/0960-1317/18/11/115011
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    • (2008) J. Micromech. Microeng. , vol.18 , pp. 115011
    • Lohmüller, T.1
  • 26
    • 34250716367 scopus 로고    scopus 로고
    • Fabrication of nanoporous silicon nitride and silicon oxide films of controlled size and porosity for combined electrochemical and waveguide measurements
    • DOI 10.1088/0957-4484/18/27/275303, PII S095744840744819X
    • E. Reimhult, K. Kumar, and W. Knoll, Nanotechnology 0957-4484 18, 275303 (2007). 10.1088/0957-4484/18/27/275303 (Pubitemid 46956773)
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    • Reimhult, E.1    Kumar, K.2    Knoll, W.3
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    • University of Twente
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.