-
1
-
-
77949316673
-
-
10.1002/wnan.50
-
S. P. Adiga, C. M. Jin, L. A. Curtiss, N. A. Monteiro-Riviere, and R. J. Narayan, Wiley Interdiscip. Rev.: Nanomed. Nanobiotechnol. 1, 568 (2009). 10.1002/wnan.50
-
(2009)
Wiley Interdiscip. Rev.: Nanomed. Nanobiotechnol.
, vol.1
, pp. 568
-
-
Adiga, S.P.1
Jin, C.M.2
Curtiss, L.A.3
Monteiro-Riviere, N.A.4
Narayan, R.J.5
-
2
-
-
67651151361
-
-
0957-4484, 10.1088/0957-4484/20/30/305304
-
S. Unnikrishnan, H. V. Jansen, F. H. Falke, N. R. Tas, H. Van Wolferen, M. J. De Boer, R. G. P. Sanders, and M. C. Elwenspoek, Nanotechnology 0957-4484 20, 305304 (2009). 10.1088/0957-4484/20/30/305304
-
(2009)
Nanotechnology
, vol.20
, pp. 305304
-
-
Unnikrishnan, S.1
Jansen, H.V.2
Falke, F.H.3
Tas, N.R.4
Van Wolferen, H.5
De Boer, M.J.6
Sanders, R.G.P.7
Elwenspoek, M.C.8
-
3
-
-
79953779409
-
-
(Professional Engineering, Westminister)
-
P. T. Riele, G. Rijnders, D. H. A. Blank, and I. M, Direct Patterning of Oxides by Pulsed Laser Stencil Deposition (Professional Engineering, Westminister, 2009).
-
(2009)
Direct Patterning of Oxides by Pulsed Laser Stencil Deposition
-
-
Riele, P.T.1
Rijnders, G.2
Blank, D.H.A.3
-
4
-
-
33745899020
-
Formation of metal nano- And micropatterns on self-assembled monolayers by pulsed laser deposition through nanostencils and electroless deposition
-
DOI 10.1002/adfm.200500933
-
E. A. Speets, P. te Riele, M. A. F. van den Boogaart, L. M. Doeswijk, B. J. Ravoo, G. Rijnders, J. Brugger, D. N. Reinhoudt, and D. H. A. Blank, Adv. Funct. Mater. 1616-301X 16, 1337 (2006). 10.1002/adfm.200500933 (Pubitemid 44049456)
-
(2006)
Advanced Functional Materials
, vol.16
, Issue.10
, pp. 1337-1342
-
-
Speets, E.A.1
Te Riele, P.2
Van Den Boogaart, M.A.F.3
Doeswijk, L.M.4
Ravoo, B.J.5
Rijnders, G.6
Brugger, J.7
Reinhoudt, D.N.8
Blank, D.H.A.9
-
5
-
-
71949104468
-
-
0040-6090, 10.1016/j.tsf.2009.03.232
-
A. Barnab́, Thin Solid Films 0040-6090 518, 1044 (2009). 10.1016/j.tsf.2009.03.232
-
(2009)
Thin Solid Films
, vol.518
, pp. 1044
-
-
Barnab́, A.1
-
6
-
-
71449105866
-
-
(unpublished)
-
O. Vazquez-Mena, T. Sannomiya, M. Tosun, G. Villanueva, J. Voros, and J. Brugger, Transducers-Solid-State Sensors, Actuators and Microsystems Conference, 2009 (unpublished), p. 465.
-
(2009)
Transducers-Solid-State Sensors, Actuators and Microsystems Conference
, pp. 465
-
-
Vazquez-Mena, O.1
Sannomiya, T.2
Tosun, M.3
Villanueva, G.4
Voros, J.5
Brugger, J.6
-
7
-
-
44149112584
-
-
0167-9317, 10.1016/j.mee.2007.12.068
-
G. Villanueva, O. Vazquez-Mena, M. A. F. van den Boogaart, K. Sidler, K. Pataky, V. Savu, and J. Brugger, Microelectron. Eng. 0167-9317 85, 1010 (2008). 10.1016/j.mee.2007.12.068
-
(2008)
Microelectron. Eng.
, vol.85
, pp. 1010
-
-
Villanueva, G.1
Vazquez-Mena, O.2
Van Den Boogaart, M.A.F.3
Sidler, K.4
Pataky, K.5
Savu, V.6
Brugger, J.7
-
8
-
-
77649173145
-
-
edited by Y. Fujisaki, R. Waser, T. Li, and C. Bonafos (Materials Research Society, Warrendale)
-
R. Diaz, in Materials and Physics for Nonvolatile Memories, edited by, Y. Fujisaki, R. Waser, T. Li, and, C. Bonafos, (Materials Research Society, Warrendale, 2009), Vol. 1160, p. 61.
-
(2009)
Materials and Physics for Nonvolatile Memories
, vol.1160
, pp. 61
-
-
Diaz, R.1
-
9
-
-
0032319282
-
-
0957-4484, 10.1088/0957-4484/9/4/007
-
C. J. M. van Rijn, G. J. Veldhuis, and S. Kuiper, Nanotechnology 0957-4484 9, 343 (1998). 10.1088/0957-4484/9/4/007
-
(1998)
Nanotechnology
, vol.9
, pp. 343
-
-
Van Rijn, C.J.M.1
Veldhuis, G.J.2
Kuiper, S.3
-
10
-
-
76949099854
-
-
0167-9317, 10.1016/j.mee.2009.10.033
-
J. Viheriälä, T. Niemi, J. Laukkanen, M. Karjalainen, and M. Pessa, Microelectron. Eng. 0167-9317 87, 1620 (2010). 10.1016/j.mee.2009.10.033
-
(2010)
Microelectron. Eng.
, vol.87
, pp. 1620
-
-
Viheriälä, J.1
Niemi, T.2
Laukkanen, J.3
Karjalainen, M.4
Pessa, M.5
-
11
-
-
70449769317
-
-
0957-4484, 10.1088/0957-4484/20/48/485303
-
A. M. Popa, P. Niedermann, H. Heinzelmann, J. A. Hubbell, and R. Pugin, Nanotechnology 0957-4484 20, 485303 (2009). 10.1088/0957-4484/20/48/485303
-
(2009)
Nanotechnology
, vol.20
, pp. 485303
-
-
Popa, A.M.1
Niedermann, P.2
Heinzelmann, H.3
Hubbell, J.A.4
Pugin, R.5
-
12
-
-
58149088399
-
-
0169-4332, 10.1016/j.apsusc.2008.11.016
-
C. Smith, B. H. Christensen, J. Chevallier, and P. Balling, Appl. Surf. Sci. 0169-4332 255, 4246 (2009). 10.1016/j.apsusc.2008.11.016
-
(2009)
Appl. Surf. Sci.
, vol.255
, pp. 4246
-
-
Smith, C.1
Christensen, B.H.2
Chevallier, J.3
Balling, P.4
-
13
-
-
77951545823
-
-
0957-4484, 10.1088/0957-4484/21/20/205301
-
M. J. K. Klein, M. Guillaumee, B. Wenger, L. A. Dunbar, J. Brugger, H. Heinzelmann, and R. Pugin, Nanotechnology 0957-4484 21, 205301 (2010). 10.1088/0957-4484/21/20/205301
-
(2010)
Nanotechnology
, vol.21
, pp. 205301
-
-
Klein, M.J.K.1
Guillaumee, M.2
Wenger, B.3
Dunbar, L.A.4
Brugger, J.5
Heinzelmann, H.6
Pugin, R.7
-
15
-
-
37149036209
-
Hole-mask colloidal lithography
-
DOI 10.1002/adma.200700680
-
H. Fredriksson, Y. Alaverdyan, A. Dmitriev, C. Langhammer, D. S. Sutherland, M. Zaech, and B. Kasemo, Adv. Mater. 0935-9648 19, 4297 (2007). 10.1002/adma.200700680 (Pubitemid 350254815)
-
(2007)
Advanced Materials
, vol.19
, Issue.23
, pp. 4297-4302
-
-
Fredriksson, H.1
Alaverdyan, Y.2
Dmitriev, A.3
Langhammer, C.4
Sutherland, D.S.5
Zach, M.6
Kasemo, B.7
-
17
-
-
77953574906
-
-
0959-9428, 10.1039/b927532k
-
J. R. Oh, J. H. Moon, H. K. Park, J. H. Park, H. Chung, J. Jeong, W. Kim, and Y. R. Do, J. Mater. Chem. 0959-9428 20, 5025 (2010). 10.1039/b927532k
-
(2010)
J. Mater. Chem.
, vol.20
, pp. 5025
-
-
Oh, J.R.1
Moon, J.H.2
Park, H.K.3
Park, J.H.4
Chung, H.5
Jeong, J.6
Kim, W.7
Do, Y.R.8
-
18
-
-
77956380081
-
-
1454-4164, 10.1002/adem.201000044
-
T. Hausöl, V. Maier, C. W. Schmidt, M. Winkler, H. W. Höppel, and M. Göken, J. Optoelectron. Adv. Mater. 1454-4164 12, 740 (2010). 10.1002/adem.201000044
-
(2010)
J. Optoelectron. Adv. Mater.
, vol.12
, pp. 740
-
-
Hausöl, T.1
Maier, V.2
Schmidt, C.W.3
Winkler, M.4
Höppel, H.W.5
Göken, M.6
-
19
-
-
84905931396
-
-
The intrinsic stress values were provided by the Center of Micro- and Nanotechnology at the Ecole Polytechnique F́d́rale de Lausanne (EPFL). Si-rich LPCVD and stoichiometric SiN films were deposited using an in-house equipment. Stress measurements were done based on wafer curvature measurements
-
The intrinsic stress values were provided by the Center of Micro- and Nanotechnology at the Ecole Polytechnique F́d́rale de Lausanne (EPFL). Si-rich LPCVD and stoichiometric SiN films were deposited using an in-house equipment. Stress measurements were done based on wafer curvature measurements.
-
-
-
-
21
-
-
0035928129
-
Nanosphere lithography: A versatile nanofabrication tool for studies of size-dependent nanoparticle optics
-
DOI 10.1021/jp010657m
-
C. L. Haynes and R. P. Van Duyne, J. Phys. Chem. B 1089-5647 105, 5599 (2001). 10.1021/jp010657m (Pubitemid 35339124)
-
(2001)
Journal of Physical Chemistry B
, vol.105
, Issue.24
, pp. 5599-5611
-
-
Haynes, C.L.1
Van Duyne, R.P.2
-
22
-
-
0031269615
-
-
0003-6951, 10.1063/1.120220
-
C. Haginoya, M. Ishibashi, and K. Koike, Appl. Phys. Lett. 0003-6951 71, 2934 (1997). 10.1063/1.120220
-
(1997)
Appl. Phys. Lett.
, vol.71
, pp. 2934
-
-
Haginoya, C.1
Ishibashi, M.2
Koike, K.3
-
23
-
-
70350436096
-
-
1616-301X, 10.1002/adfm.200900907
-
A. Plettl, F. Enderle, M. Saitner, A. Manzke, C. Pfahler, S. Wiedemann, and P. Ziemann, Adv. Funct. Mater. 1616-301X 19, 3279 (2009). 10.1002/adfm.200900907
-
(2009)
Adv. Funct. Mater.
, vol.19
, pp. 3279
-
-
Plettl, A.1
Enderle, F.2
Saitner, M.3
Manzke, A.4
Pfahler, C.5
Wiedemann, S.6
Ziemann, P.7
-
24
-
-
84905958566
-
-
(unpublished)
-
H. G. Elias (unpublished).
-
-
-
Elias, H.G.1
-
25
-
-
58149339567
-
-
0960-1317, 10.1088/0960-1317/18/11/115011
-
T. Lohmüller, J. Micromech. Microeng. 0960-1317 18, 115011 (2008). 10.1088/0960-1317/18/11/115011
-
(2008)
J. Micromech. Microeng.
, vol.18
, pp. 115011
-
-
Lohmüller, T.1
-
26
-
-
34250716367
-
Fabrication of nanoporous silicon nitride and silicon oxide films of controlled size and porosity for combined electrochemical and waveguide measurements
-
DOI 10.1088/0957-4484/18/27/275303, PII S095744840744819X
-
E. Reimhult, K. Kumar, and W. Knoll, Nanotechnology 0957-4484 18, 275303 (2007). 10.1088/0957-4484/18/27/275303 (Pubitemid 46956773)
-
(2007)
Nanotechnology
, vol.18
, Issue.27
, pp. 275303
-
-
Reimhult, E.1
Kumar, K.2
Knoll, W.3
-
27
-
-
0038329685
-
-
(Springer-Verlag, Berlin)
-
A. Schilp, M. Hausner, M. Puech, N. Launay, H. Karagoezoglu, and F. Laermer, Advanced Etch Tool for High Etch Rate Deep Reactive Ion Etching in Silicon Micromachining Production Environment (Springer-Verlag, Berlin, 2001).
-
(2001)
Advanced Etch Tool for High Etch Rate Deep Reactive Ion Etching in Silicon Micromachining Production Environment
-
-
Schilp, A.1
Hausner, M.2
Puech, M.3
Launay, N.4
Karagoezoglu, H.5
Laermer, F.6
-
28
-
-
0033715377
-
-
0960-1317, 10.1088/0960-1317/10/2/312
-
S. Kuiper, M. de Boer, C. van Rijn, W. Nijdam, G. Krijnen, and M. Elwenspoek, J. Micromech. Microeng. 0960-1317 10, 171 (2000). 10.1088/0960-1317/10/2/312
-
(2000)
J. Micromech. Microeng.
, vol.10
, pp. 171
-
-
Kuiper, S.1
De Boer, M.2
Van Rijn, C.3
Nijdam, W.4
Krijnen, G.5
Elwenspoek, M.6
-
30
-
-
79953772852
-
-
University of Twente
-
S. Kuiper, University of Twente, 2000.
-
(2000)
-
-
Kuiper, S.1
-
31
-
-
70349665405
-
-
0957-4484, 10.1088/0957-4484/20/41/415303
-
O. Vazquez-Mena, L. G. Villanueva, V. Savu, K. Sidler, P. Langlet, and J. Brugger, Nanotechnology 0957-4484 20, 415303 (2009). 10.1088/0957-4484/20/41/ 415303
-
(2009)
Nanotechnology
, vol.20
, pp. 415303
-
-
Vazquez-Mena, O.1
Villanueva, L.G.2
Savu, V.3
Sidler, K.4
Langlet, P.5
Brugger, J.6
|