Measurement of the lattice parameter of a silicon crystal

New Journal of Physics

Volumn 11, Issue , 2009, Pages

  Massa, E ^a,b,c   Mana, G ^a,b,c   Kuetgens, U ^a,b,c   Ferroglio, L ^a,b,c  

^a ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c POLITECNICO DI TORINO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL APPARATUS; FUNDAMENTAL PHYSICAL CONSTANT; INTERNATIONAL PROJECTS; LATTICE PARAMETER MEASUREMENT; LATTICE PARAMETERS; MOLAR VOLUMES; OPTICAL INTERFEROMETRY; PERFORMANCE TESTING; SILICON CRYSTAL; TEST RESULTS;

INTERFEROMETERS; INTERFEROMETRY; PARAMETER ESTIMATION; X RAY APPARATUS;

LATTICE CONSTANTS;

EID: 67649339303     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/5/053013     Document Type: Article

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