Confirmation of the INRiM and PTB determinations of the Si lattice parameter

IEEE Transactions on Instrumentation and Measurement

Volumn 56, Issue 2, 2007, Pages 230-234

  Becker, Peter ^a   Cavagnero, Giovanni ^b   Kuetgens, Ulrich ^a   Mana, Giovanni ^b   Massa, Enrico ^b  

^a PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^b ISTITUTO NAZIONALE DI RICERCA METROLOGICA   (Italy)

Author keywords

Avogadro's constant; Combined X ray and optical interferometry; Si lattice parameter

Indexed keywords

INTERFEROMETRY; LASER BEAMS; LATTICE CONSTANTS; OPTICAL FREQUENCY CONVERSION;

OPTICAL INTERFEROMETRY; X-RAY INTERFEROMETRY;

SILICON;

EID: 34047214886     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2007.890618     Document Type: Conference Paper

References (14)

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