To integrate or not to integrate

Proceedings of IEEE Sensors

Volumn , Issue , 2010, Pages 2179-2185

  French, P J ^a   Sarro, P M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL ISSUES; FULL INTEGRATION; HALL PLATES; INTEGRATED MICROSYSTEMS; MICROMACHINING TECHNIQUES; POTENTIAL PROBLEMS; PROCESS YIELD; SENSORS AND ACTUATORS; SYSTEM-IN-A-PACKAGE; SYSTEM-ON-A-CHIP;

ACCELEROMETERS; APPLICATION SPECIFIC INTEGRATED CIRCUITS; SILICON SENSORS;

COMMERCE;

EID: 79951872819     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSENS.2010.5690592     Document Type: Conference Paper

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