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Japanese Journal of Applied Physics

Volumn 49, Issue 11, 2010, Pages

Development of near-field microwave microscope with the functionality of scanning tunneling spectroscopy

(6) Machida, Tadashi a Gaifullin, Marat B a,b Ooi, Shuuich a Kato, Takuya c Sakata, Hideaki c Hirata, Kazuto a

a NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

b LOUGHBOROUGH UNIVERSITY (United Kingdom)

c TOKYO UNIVERSITY OF SCIENCE (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL DATA; LOCAL DENSITY; LOW RESISTANCE; MICROWAVE DETECTION; NANO SCALE; NEAR-FIELD MICROWAVE MICROSCOPES; NEAR-FIELD SCANNING MICROWAVE MICROSCOPE; OHMIC LOSS; PYROLITIC GRAPHITE; SCANNING TUNNELING SPECTROSCOPY; SIMULTANEOUS MEASUREMENT;

SCANNING TUNNELING MICROSCOPY; SPECTROSCOPY;

MICROSCOPES;

EID: 79551624700 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.49.116701 Document Type: Article

Times cited : (4)

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