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Volumn 71, Issue 14, 1997, Pages 2026-2028

Low temperature scanning-tip microwave near-field microscopy of YBa2Cu3O7-x films

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE SUPERCONDUCTORS; MICROSCOPIC EXAMINATION; MICROWAVE DEVICES; SCANNING TUNNELING MICROSCOPY; SUPERCONDUCTING TRANSITION TEMPERATURE; THIN FILMS; YTTRIUM COMPOUNDS;

EID: 0031556429     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.119776     Document Type: Article
Times cited : (57)

References (10)
  • 2
    • 5944247810 scopus 로고
    • Scanned Probe Microscopy
    • See, for example, Scanning Tunneling Microscopy III, edited by R. Wiesendanger and H.-J. Guntherodt (Springer, Berlin, 1993); Scanned Probe Microscopy, edited by H. Kumar Wickramasinghe, AIP Conf. Proc. 241 (1991).
    • (1991) AIP Conf. Proc. , vol.241
    • Kumar Wickramasinghe, H.1
  • 7
    • 15844418761 scopus 로고    scopus 로고
    • unpublished
    • J. Gallop, L. Hao, and F. Abbas (unpublished); M. Golosovsky and D. Davidov, Appl. Phys. Lett. 68, 1579 (1996).
    • Gallop, J.1    Hao, L.2    Abbas, F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.