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Volumn 81, Issue 12, 2010, Pages

Measurement of thermal properties of thin films up to high temperatures-Pulsed photothermal radiometry system and Si-B-C-N films

Author keywords

[No Author keywords available]

Indexed keywords

BULK SAMPLES; CHEMICAL COMPOSITIONS; EFFUSIVITY; HIGH SPEED MACHINING; HIGH TEMPERATURE; HIGH-TEMPERATURE ELECTRONICS; HIGHER TEMPERATURES; INDEPENDENT MEASUREMENT; MEASUREMENT OF THERMAL PROPERTIES; MEASUREMENT SYSTEM; MECHANICAL AND THERMAL PROPERTIES; PULSED PHOTOTHERMAL RADIOMETRY; ROOM TEMPERATURE; SI-B-C-N FILMS; SIMULTANEOUS DETERMINATIONS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; THERMAL PROPERTIES; THERMAL STABILITY; VACUUM CHAMBERS;

EID: 78650880810     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3506638     Document Type: Article
Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.