Thin film nanocalorimeter for heat capacity measurements of 30 nm films

Review of Scientific Instruments

Volumn 80, Issue 6, 2009, Pages

  Queen, D R ^a   Hellman, F ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE ACCURACY; AU FILM; BULK VALUE; HEAT CAPACITIES; HEAT CAPACITY MEASUREMENTS; HIGH MAGNETIC FIELDS; LOW STRESS; ROOM TEMPERATURE; SILICON NITRIDE MEMBRANE; TEMPERATURE RANGE;

CALORIMETRY; COPPER; MAGNETIC FIELDS; SILICON NITRIDE; SPECIFIC HEAT; THIN FILMS;

GOLD;

EID: 67650284277     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3142463     Document Type: Article

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