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Volumn 100, Issue 3-4, 2004, Pages 241-251

Calibration of AFM cantilever stiffness: A microfabricated array of reflective springs

Author keywords

07.10.Cm; 07.10.Pz; 07.79.Lh; 81.07. b; 81.70.Bt; 85.85.+j; 87.15.La; 87.64.Dz; AFM; Atomic force microscopy; Calibration; Nanonewton; Piconewton; Spring constant

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALIBRATION; CHROMIUM; DATA REDUCTION; GOLD; MICROMACHINING; POLYMERS; POLYSILICON;

EID: 3042568780     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2003.10.005     Document Type: Conference Paper
Times cited : (46)

References (19)
  • 1
    • 0033153911 scopus 로고    scopus 로고
    • Force-distance curves by atomic force microscopy
    • Cappella B., Dietler G. Force-distance curves by atomic force microscopy. Surf. Sci. Rep. 34:1999;1
    • (1999) Surf. Sci. Rep. , vol.34 , pp. 1
    • Cappella, B.1    Dietler, G.2
  • 2
    • 0003739507 scopus 로고    scopus 로고
    • R.J. Colton, A. Engel, J.E. Frommer, H.E. Gaub, A.A. Gewirth, R. Guckenberger, J. Rabe, W.M. Heckl, B. Parkinson (Eds.), Wiley, Chichester, UK
    • J. Colchero, in: R.J. Colton, A. Engel, J.E. Frommer, H.E. Gaub, A.A. Gewirth, R. Guckenberger, J. Rabe, W.M. Heckl, B. Parkinson (Eds.), Procedures in Scanning Probe Microscopies, Wiley, Chichester, UK, 1998.
    • (1998) Procedures in Scanning Probe Microscopies
    • Colchero, J.1
  • 5
  • 10
    • 3042566546 scopus 로고    scopus 로고
    • Polytec GmbH, Polytec-Platz 1-7, 76337 Waldbronn, Germany.
    • Polytec GmbH, Polytec-Platz 1-7, 76337 Waldbronn, Germany.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.