Application of Delaunay tessellation for the characterization of solute-rich clusters in atom probe tomography

Ultramicroscopy

Volumn 111, Issue 3, 2011, Pages 200-206

  Lefebvre, W ^a   Philippe, T ^a   Vurpillot, F ^a  

^a UNIVERSITÉ DE ROUEN   (France)

Author keywords

Algorithm; Atom Probe Tomography; Cluster search; Clustering; Delaunay; Methodology; Precipitation

Indexed keywords

ATOM PROBE TOMOGRAPHY; CLUSTER SEARCH; CLUSTERING; DELAUNAY; METHODOLOGY; PRECIPITATION;

ALGORITHMS; MATHEMATICAL MODELS; PROBES; TOMOGRAPHY;

ATOMS;

ALGORITHM; ANALYTIC METHOD; ARTICLE; ATOM PROBE TOMOGRAPHY; CELL EXPANSION; CLUSTER ANALYSIS; DELAUNAY TESSELLATION; EROSION; EXTRACELLULAR MATRIX; MATHEMATICAL ANALYSIS; MATHEMATICAL MODEL; METHODOLOGY; POISSON DISTRIBUTION; SENSITIVITY AND SPECIFICITY; TOMOGRAPHY;

EID: 78650049116     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2010.11.034     Document Type: Article

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