Atom probe tomography: A technique for nanoscale characterization

Microscopy and Microanalysis

Volumn 10, Issue 3, 2004, Pages 336-341

  Miller, M K ^a   Kenik, E A ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Atom probe; Microstructural characterization

Indexed keywords

ALLOY; IRON; OXIDE; OXYGEN; STEEL; TITANIUM; YTTRIUM;

CHEMISTRY; CONFERENCE PAPER; ELECTRON PROBE MICROANALYSIS; METHODOLOGY; NANOTECHNOLOGY; PARTICLE SIZE; TOMOGRAPHY;

ALLOYS; ELECTRON PROBE MICROANALYSIS; IRON; NANOTECHNOLOGY; OXIDES; OXYGEN; PARTICLE SIZE; STEEL; TITANIUM; TOMOGRAPHY; YTTRIUM;

EID: 3042525131     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927604040577     Document Type: Conference Paper

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