Clustering and nearest neighbour distances in atom probe tomography: The influence of the interfaces

Journal of Microscopy

Volumn 239, Issue 1, 2010, Pages 72-77

  Philippe, T ^a   Cojocaru MirEdin O ^a   Duguay, S ^a   Blavette, D ^b  

^a Site Universitaire Du Madrillet   (France)

^b INSTITUT UNIVERSITAIRE DE FRANCE   (France)

Author keywords

1NN method; Atom probe tomography; Clustering; Interface; Nearest neighbour distances; Statistics

Indexed keywords

ATOMS; PROBES;

1NN METHOD; ATOM-PROBE TOMOGRAPHY; ATOMIC FIELDS; CLUSTERINGS; CORE COMPOSITION; INTERFACE REGIONS; INTERFACE WIDTHS; MATRIX INTERFACES; NEAREST NEIGHBOR DISTANCE; NEW APPROACHES;

BORON;

BORON; SILICON;

ARTICLE; ATOM PROBE TOMOGRAPHY; COMPARATIVE STUDY; CONTROLLED STUDY; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; MATHEMATICAL MODEL; PRIORITY JOURNAL; TOMOGRAPHY;

EID: 77953839550     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03359.x     Document Type: Article

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