Efficient sampling for three-dimensional atom probe microscopy data

Ultramicroscopy

Volumn 95, Issue SUPPL., 2003, Pages 199-205

  Hellman, Olof C ^a   Du Rivage, John Blatz ^a   Seidman, David N ^a  

^a Northwestern University   (United States)

Author keywords

Isoconcentration surface; Sampling algorithm; Three dimensional atom probe

Indexed keywords

ALGORITHMS; DATA ACQUISITION; DEGREES OF FREEDOM (MECHANICS); GRAIN SIZE AND SHAPE; SAMPLING;

CONCENTRATION PROFILES;

MICROSCOPIC EXAMINATION;

ALGORITHM; ANALYTIC METHOD; ANALYTICAL ERROR; ARTICLE; ATOM; CALCULATION; DIFFUSION; MICROSCOPY;

EID: 0037402097     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00317-0     Document Type: Article

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