Exploring the next neighbourhood relationship in amorphous alloys utilizing atom probe tomography

Ultramicroscopy

Volumn 107, Issue 9, 2007, Pages 773-780

  Shariq, Ahmed ^a,c   Al Kassab, Talaat ^a   Kirchheim, Reiner ^a   Schwarz, Ricardo B ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c NATIONAL UNIVERSITY OF SCIENCES AND TECHNOLOGY   (Pakistan)

Author keywords

Amorphous alloys; Atom probe field ion microscopy; Data processing; Next neighbourhood evaluation algorithm

Indexed keywords

ALGORITHMS; COMPUTATIONAL METHODS; DATA PROCESSING; DATA REDUCTION; TOMOGRAPHY;

ATOM PROBE FIELD ION MICROSCOPY; ATOMIC DISTANCES; NEXT NEIGHBOURHOOD EVALUATION ALGORITHM; RECONSTRUCTION PARAMETERS;

AMORPHOUS ALLOYS;

ALLOY; COPPER DERIVATIVE; PALLADIUM; PHOSPHORUS DERIVATIVE;

ALGORITHM; ANALYTIC METHOD; ARTICLE; ATOM; COMPARATIVE STUDY; CORRELATION ANALYSIS; ELECTRON MICROSCOPY; EVAPORATION; PROBABILITY; TOMOGRAPHY;

EID: 34249291084     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.02.030     Document Type: Article

References (26)

1. O'Handley R.C. J. Appl. Phys. 62-10 (1987) R15
2. Dixmier J., and Sadoc J.F. Metallic Glasses; Materials Science Seminar (1976), American Society for Metals, Metals Park, OH 97
3. Oehring M., and Hassen P. J. Phys. 47 C7 (1986) 275
4. Macht M.P., Wanderka N., Wiedenmann A., Wollenberger H., Wei Q., Fecht H.J., and Klose S.G. Mater. Sci. Forum 65 (1996) 225
5. Miller M.K. Mater. Sci. Eng. A 250 (1998) 133
6. Busch R., Schneider S., Peker A., and Johnson W.L. Appl. Phys. Lett. 67 (1995) 1544
7. A. Heinrich, T. Al-kassab, R. Kirchheim, in: Conference Proceedings IFES04 (2004) 134.
8. De Geuser F., Lefebvre W., and Blavette D. Phil. Magz. Lett. 86-4 (2006) 227
9. C.K. Sudbrack, Ph.D. Thesis, Northwestern University, 2004.
10. A. Shariq, T. Al-Kassab, in: Conference Proceedings of the SCANDEM 2006 (2006), 40.
11. Larson D.J., Foord D.T., Petford-Long A.K., Anthony T.C., Rozdilsky I.M., Cerezo A., and Smith G.D.W. Ultramicroscopy 75 (1998) 147
12. Blavette D., Deconihout B., Bostel A., Sarrau J.M., Bouet M., and Menand A. Rev. Sci. Instrum. 64-10 (1993) 2911
13. Al-Kassab T., Wollenberger H., Schmitz G., and Kirchheim R. In: Ernst F., and Rühler M. (Eds). High Resolution Imaging and Spectrometry of Materials, Springer Series of Material Science (2003), Springer, Berlin, Heidelberg 274-320 (Chapter 6)
14. Miller M.K., Shen T.D., and Schwarz R.B. J. Non-cryst. Solids 317 (2003) 10
15. A. Shariq, PhD Thesis, Göttingen University, 2006.
16. Elliott S.R. Physics of amorphous materials. second edition (1990), Longman Group, UK limited
17. Wong J. In: Güntherodt H.-J., and Beck H. (Eds). EXAF studies of metallic glasses, Glassy Metals I; Ionic Structure, Electronic Transport and Crystallization, Topics in Applied Physics Vol. 46 (1981), Springer BHNYT, Berlin 45-78 (Chapter 4)
18. Gaskell P.H. In: Beck H., and Güntherodt H.-J. (Eds). Glassy Metals II; Atomic Structure and Dynamics, Electronic Structure and Magnetic Properties, Topics in Applied Physics Vol. 53 (1983), Springer BHNYT, Berlin 5-50
19. Duine P.A., Sietsma J., and Thijsse B.J. Phys. Rev. B 50-18 (1994) 13240
20. Maret M., Chieux P., Hicter P., Atzmon M., and Johnson W.L. J. Phys. F: Met. Phys. 17 (1987) 315
21. Sadoc J.F., and Dixmier J. Mater. Sci. Eng. 23 (1976) 187
22. Miller M.K., and Smith G.D.W. Atom Probe Microanalysis; Principles and Applications to Materials Problems (1989), Materials Research Society
23. Bas P., Bostel A., Deconihout B., and Blavette D. Appl. Surf. Sci. 87/88 (1995) 298
24. Vurpillot F., Renaud L., and Blavette D. Ultramicroscopy 95 (2003) 223
25. Häussler P. J. Physique (Paris) C 8 (1985) 361
26. H. Teichler, Unpublished data, Private communication, Institut für Materialphsik, Universität Göttingen, 2006.